Вышедшие номера
IBIC characterization of charge transport in CdTe : Cl
Sellin P.J.1, Davies A.W.1, Boroumand F.1, Lohstroh A.1, Ozsan M.E.1, Parkin J.1, Veale M.1
1Department of Physics, University of Surrey, Guildford GU2 7XH, UK
Поступила в редакцию: 12 сентября 2006 г.
Выставление онлайн: 19 марта 2007 г.

Studies of charge transport uniformity in bulk CdTe : Cl have been carried out using ion beam induced charge (IBIC) imaging. High resolution maps of charge collection efficiency, mobility-lifetime product (mutau) and drift mobility (mu) were measured using a scanning microbeam of 2 MeV protons focused to a beam diameter of ~3 mum. Excellent charge transport uniformity was observed in single crystal CdTe : Cl, with electron mutau values of up to 5·10-3 cm2/Vs. The presence of extended defects such as tellurium inclusions was also studied using IBIC, and their influence on the charge transport performance of CdTe detector structures is discussed. PACS: 72.80.Jc, 79.20.Rf, 61.80.Jh