"Физика и техника полупроводников"
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REFERENCES

1. Gemanium-Based Technologies. From Materials to Devices, Ed. C. Claeys and E. Simoen. (Elsevier, Amsterdam etc., 2007).

2. G.D. Watkins, Mater. Sci. in Semicond. Proces., 3, 227 (2000).

3. J.S. Blakemore, Semiconductor Statistics ( Pergamon, Oxford, 1962).

4. G.D. Watkins and J.W. Corbett, Phys. Rev. A, 134, 1359 (1964).

9. E.L. Elkin and G.D. Watkins. Phys. Rev., 174, 881 (1968).

10. R. Krause-Rehberg and H.S. Leipner, Positron Annihilation in Semiconductors. Defect Studies, Springer Ser. Solid State Sci., vol. 127 (1999).

11. A. Nylandsted Larsen and A. Mesli, Physica B 401-402, 85 (2007)

12. N.S. Patel’, C. Monmeyran, A. Agarwal, and L.C. Kimerling, J. Appl. Phys. 118, 155702 (2015).

13. J. Fage-Pedersen, A. Nylandsted Larsen, and A. Mesli, Phys. Rev. B 62, 10116 (2000).

14. C. Nyamhere, F.D. Auret, A.G.M. Das, and A. Chawanda, Physica B 401-402, 499 (2007).

15. C.E. Lindberg, J. Lundsgaard Hansen, P. Bornholt, A. Mesli, K. Bonde Nielsen, A. Nylandsted Larsen, and L. Dobaczewski, Appl. Phys. Lett. 87, 172103 (2005).

16. A. Nylandsted Larsen, A. Mesli, K.B. Nielsen, H. Kortegaard Nielsen, L. Dobaczewski, J. Adey, R. Jones, D.W. Palmer, P.R. Briddon, and S. Ӧberg, Phys. Rev. Lett., 97, 106402 (2006).

17. P. Vanmeerbeek, P. Clauws, H. Vrielinck, B. Pajot, L. Van Hoorebeke, and A. Nylandsted Larsen, Phys. Rev. B 70, 035203 (2004).

18. L.I. Khirunenko, Yu. V. Pomozov, M.G. Sosnin, N.V. Abrosimov, and H. Riemann, AIP Conf. Proc. 1583, 100 (2014).