Multiphonon electron capture on mercury vacancy states in "wide-bandgap" layers of HgCdTe
Bekin N. A. 1, Kozlov D. V. 1
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: nbekin@ipmras.ru

PDF
Using the adiabatic approximation, the capture coefficient of conduction band electrons on A2-2 mercury vacancy levels in HgCdTe semiconductors with a band gap of more than ~100 meV (with a Cd fraction in the solution x>0.2) was estimated. It is shown that electron capture on the vacancies is significantly suppressed with an increase in the cadmium content. For example, the low-temperature capture coefficient decreases from ~ 10-8 cm3·s-1 at x=0.21 to ~10-12 cm3·s-1 at x=0.25. The low rate of electron capture in wide-bandgap HgCdTe layers is mainly due to the significant distance of mercury vacancy levels from the bottom of the conduction band, as well as the moderately weak electron-phonon coupling of electrons localized in vacancies (Huang-Rhys factor S<0.5). Keywords: deep defects, mercury vacancies, HgCdTe, multiphonon electron capture, adiabatic approximation.
  1. M. Orlita, K. Masztalerz, C. Faugeras, M. Potemski, E.G. Novik, C. Brune, H. Buhmann, L.W. Molenkamp. Phys. Rev. B, 83, 115307 (2011)
  2. B.A. Bernevig, T.L. Hughes, S.-C. Zhang. Science, 314, 1757 (2006)
  3. M. Konig, S. Wiedmann, C. Brune, A. Roth, H. Buhmann, L.W. Molenkamp, X.-L. Qi, S.-C. Zhang. Science, 318, 766 (2007)
  4. M. Orlita, D.M. Basko, M.S. Zholudev, F. Teppe, W. Knap, V.I. Gavrilenko, N.N. Mikhailov, S.A. Dvoretskii, P. Neugebauer, C. Faugeras, A.-L. Barra, G. Martinez, M. Potemski. Nature Physics, 10, 233 (2014)
  5. A. Rogalski. Opto-Electron. Rev., 20, 279 (2012)
  6. S.V. Morozov, V.V. Rumyantsev, M.A. Fadeev, M.S. Zholudev, K.E. Kudryavtsev, A.V. Antonov, A.M. Kadykov, A.A. Dubinov, N.N. Mikhailov, S.A. Dvoretsky, V.I. Gavrilenko. Appl. Phys. Lett., 111, 192101 (2017)
  7. K.E. Kudryavtsev, V.V. Rumyantsev, V.V. Utochkin, M.A. Fadeev, V.Ya. Aleshkin, A.A. Dubinov, M.S. Zholudev, N.N. Mikhailov, S.A. Dvoretskii, V.G. Remesnik, F. Teppe, V.I. Gavrilenko, S.V. Morozov. J. Appl. Phys., 130, 214302 (2021)
  8. W. Shockley, W.T. Read, jr. Phys. Rev., 87, 835 (1952)
  9. R.N. Hall. Phys. Rev., 87, 387 (1952)
  10. D.V. Kozlov, V.V. Rumyantsev, A.A. Yantser, S.V. Morozov, V.I. Gavrilenko. JETP 165 (6), 852 (2024)
  11. D.V. Kozlov, A.V. Ikonnikov, K.A. Mazhukina, S.V. Morozov, V.I. Gavrilenko, N.N. Mikhailov, S.A. Dvoretsky, V.V. Rumyantsev. Semicond. Sci. Technol., 40, 035007 (2025)
  12. V.A. Kovarskii, N.F. Perel'man, I.Sh. Averbukh. Mnogokvantovye protsessy (M., Energoatomizdat, 1985). (in Russian)
  13. D.V. Kozlov, V.V. Rumyantsev, S.V. Morozov, A.M. Kadykov, M.A. Fadeev, H.-W. Hubers, V.I. Gavrilenko. Semiconductors, 52, 1369 (2018)
  14. I.B. Bersuker. The Jahn-Teller Effect (Cambridge University Press, UK, 2006)
  15. E. Gutsche. Phys. Status Solidi B, 109, 583 (1982)
  16. V.F. Gantmakher, I.B. Levinson. Rasseyanie nositelej toka v metallakh i poluprovodnikakh (M., Nauka, 1984). (in Russian)
  17. N.A. Bekin, R.Kh. Zhukavin, V.V. Tsyplenkov, V.N. Shastin. Semiconductors, 58, 7 (2024)
  18. D.V. Kozlov, V.V. Rumyantsev, S.V. Morozov, A.M. Kadykov, M.A. Fadeev, H.-W. Hubers, V.I. Gavrilenko. Semiconductors, 52, 1369 (2018)
  19. N.O. Lipari, A. Baldereschi, M.L.W. Thewalt. Solid State Commun., 33, 277 (1980)
  20. S. Adachi. Properties of Group-IV, III-V and II-VI Semiconductors (John Wiley \& Sons, Ltd, 2005)
  21. J.P. Laurenti, J. Camassel, A. Bouhemadou, B. Toulouse, R. Legros, A. Lusson. J. Appl. Phys., 67, 6454 (1990)
  22. Handbook of Mathematical Functions With Formulas, Graphs, and Mathematical Tables, ed. by M. Abramowitz, I. Stegun. National Bureau of Standards Applied Mathematics Series 55, 1972
  23. V.N. Abakumov, V.I. Perel', I.N. YAssievich. Bezyzluchatel'naya rekombinaciya v poluprovodnikah (SPb., Izd-vo "Peterburgskij institut yadernoj fiziki im. B.P. Konstantinova RAN", 1997). (in Russian)
Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru