Modeling the electron distribution profile on a luminescent screen during the studying a semiconductor field cathode
Kolosko A. G. 1, Mutygullin B. E. 2, Fillipov S. V.1, Popov E. O.1, Sokov S. A. 1, Nechaev M. S. 1, Lobanov B. V. 3, Demin G. D.3, Mitskevich A. A. 4
1Ioffe Institute, St. Petersburg, Russia
2Peter the Great Saint-Petersburg Polytechnic University, St. Petersburg, Russia
3National Research University of Electronic Technology, Zelenograd, Moscow, Russia
4Bonch-Bruevich St. Petersburg State University of Telecommunications, St. Petersburg, Russia
Email: agkolosko@mail.ru
Presents an algorithm for modeling the profile of the emission current density distribution over the surface of a flat conductive anode during cold field emission from a pyramid-shaped semiconductor cathode with a hemispherical tip. The development includes constructing electron trajectories as they move from the cathode to the anode and processing the data obtained using integral approximation calculations. Keywords: field emission from semiconductors, modeling of electron trajectories in COMSOL, current density distribution, field emission projector.
- N.V. Egorov, E.P. Sheshin. Field Emission Electronics. Springer Ser. in Advanced Microelectron., 60, 568 (2017). DOI: 10.1007/978-3-319-56561-3
- R. Patra, A. Singh, V.D. Vankar, S. Ghosh. Adv. Mater. Lett., 7 (10), 771 (2016). DOI: 10.5185/amlett.2016.6368
- M.M. Kopelvski, E. Galeazzo, H.E. Peres, F.J. Ramirez-Fernandez, D.A. Silva, M.O. Dantas. Measurement, 93, 208 (2016). DOI: 10.1016/j.measurement.2016.07.022
- A.G. Kolosko, S.V. Filippov, E.O. Popov. St. Petersburg Polytechnic University J. Phys. and Math., 16 (1.2), (2023). DOI: 10.18721/JPM.161.205
- A.G. Kolosko, E.O. Popov, S.V. Filippov, B.E. Mutygullin. Pisma v Zhurnal Tekhnicheskoi Fiziki, 50 (24), 26 (2024). DOI: 10.61011/PJTF.2024.24.59433.6598k
- M. Marchand, C. Journet, C. Adessi, S.T. Purcell. Phys. Rev. B, 80 (24), 245425-1-6 (2009). DOI: 10.1103/PhysRevB.80.245425
- C.A. Spindt, I. Brodie, L. Humphrey, E.R. Westerberg. J. Appl. Phys., 47 (12), 5248 (1976). DOI: 10.1063/1.322600
- M. Ding, G. Sha, A.I. Akinwande. IEEE Trans. Electron Dev., 49 (12), 2333 (2002). DOI: 10.1109/TED.2002.805230
- X. Wang, Z. Lin, K. Qi, Z. Chen, Z. Wang, Y. Jiang. J. Phys. D: Appl. Phys., 40 (16), 4775 (2007). DOI: 10.1088/0022-3727/40/16/006
- W.P. Dyke, J.K. Trolan, E.E. Martin, J.P. Barbour. Phys. Rev., 91 (5), 1043 (1953). DOI: 10.1103/PhysRev.91.1043
- G. Rughoobur, O.O. Ilori, A.I. Akinwande. J. Vac. Sci. Technol. B, 40 (4), 042803-1-8 (2022). DOI: 10.1116/6.0001938
- R. Stratton. Phys. Rev., 125, 67 (1962). DOI: 10.1103/PhysRev.125.67
- K.N. Nikolsky, A.S. Baturin, A.I. Knyazev, R.G. Chesov, E.P. Sheshin. ZhTF, 74 (2), 110 (2004). (in Russian). ISSN 0044-4642
- S.V. Bhosale, S.R. Suryawanshi, S.V. Bhoraskar, M.A. More, D.S. Joag, V.L. Mathe. Mater. Res. Express, 2 (9), 095001-1-12 (2015). DOI: 10.1088/2053-1591/2/9/095001
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