Grigoryev L. V. 1,2, Semenov A. A.2, Mikhailov A. V.3
1St. Petersburg State University, St. Petersburg, Russia
2
3Vavilov State Optical Institute, St. Petersburg, Russia
Email: lvgrigoryev@mail.ru
The results of the study of the structural and photoelectric properties of the ZnO-LiTaO3 thin-film structure are presented. The results X-ray structural analysis and results atomic-force microscopy of the surface zinc oxide thin films synthesized on a single-crystal lithium tantalite substrate and on a KU-1 quartz substrate are presented. The spectral dependence of photoconductivity in the thin film structure of ZnO-LiTaO3 and the structure of ZnO-quartz in the ultraviolet and visible spectral ranges are presented. Keywords: zinc oxide, laser ablation, ferroelectric materials, X-ray structural analysis, atomic-force microscopy surface, photoconductivity, method Tikhonov-Lavrentiev regularization.
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