Papikyan A. K1, Harutyunyan S. R.2,1, Aghamalyan N. R.2,1, Hovsepyan R. K.2,1, Khachaturova A. 2, Petrosyan S. I.2,1, Badalyan G. R.2, Kafadaryan Y. A.2,1
1Russian–Armenian University, Yerevan, Armenia
2Institute for Physical Research, National Academy of Sciences of Armenia, Ashtarak, Armenia
Email: papikyanarman.pap@gmail.com, sergeyhar56@gmail.com, natagham@gmail.com, ruben.ovsepyan@mail.ru, annakhachat@mail.ru, spetrosyan8@gmail.com, gbadalyan@mail.ru, ekafadaryan@gmail.com
Single-layer Sb2Te3 films and three-layer Sb2Te3/Sb2S3/Sb2Te3 structures are obtained by thermal vacuum deposition. Their thermoelectric characteristics have been investigated in a wide temperature range (5-350 K). It is shown that the conductivity of Sb2Te3/Sb2S3/Sb2Te3 has a semiconductor behavior, the resistivity is an order of magnitude higher than the resistivity of the Sb2Te3 film; the Seebeck coefficient of Sb2Te3/Sb2S3/Sb2Te3 is 1.5 and 3 times higher than the Seebeck coefficient of the film and single-crystal Sb2Te3, respectively. The current-voltage characteristics of the Sb2Te3 film exhibit memristive properties with unipolar resistive switching, whereas Sb2Te3/Sb2S3/Sb2Te3 can be considered as a memristor with a parallel connected capacitance. Keywords: Sb2S3, Sb2Te3, films, volt-ampere characteristic, Seebeck coefficient, memristor.
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