Thermoelectric and memristive features of the Sb2Te3/Sb2S3/Sb2Te3 and Ag/Sb2Te3/Ag structures
Papikyan A. K1, Harutyunyan S. R.2,1, Aghamalyan N. R.2,1, Hovsepyan R. K.2,1, Khachaturova A. 2, Petrosyan S. I.2,1, Badalyan G. R.2, Kafadaryan Y. A.2,1
1Russian–Armenian University, Yerevan, Armenia
2Institute for Physical Research, National Academy of Sciences of Armenia, Ashtarak, Armenia
Email: papikyanarman.pap@gmail.com, sergeyhar56@gmail.com, natagham@gmail.com, ruben.ovsepyan@mail.ru, annakhachat@mail.ru, spetrosyan8@gmail.com, gbadalyan@mail.ru, ekafadaryan@gmail.com

PDF
Single-layer Sb2Te3 films and three-layer Sb2Te3/Sb2S3/Sb2Te3 structures are obtained by thermal vacuum deposition. Their thermoelectric characteristics have been investigated in a wide temperature range (5-350 K). It is shown that the conductivity of Sb2Te3/Sb2S3/Sb2Te3 has a semiconductor behavior, the resistivity is an order of magnitude higher than the resistivity of the Sb2Te3 film; the Seebeck coefficient of Sb2Te3/Sb2S3/Sb2Te3 is 1.5 and 3 times higher than the Seebeck coefficient of the film and single-crystal Sb2Te3, respectively. The current-voltage characteristics of the Sb2Te3 film exhibit memristive properties with unipolar resistive switching, whereas Sb2Te3/Sb2S3/Sb2Te3 can be considered as a memristor with a parallel connected capacitance. Keywords: Sb2S3, Sb2Te3, films, volt-ampere characteristic, Seebeck coefficient, memristor.
  1. Terry M. Tritt. Annu. Rev. Mater. Res., 41, 433 (2011)
  2. H.J. Goldsmid. Introduction to Thermoelectricity (Springer Series in Mater. Sci., 2010) p. 60
  3. S.V. Ovsyannikov, V.V. Shchennikov. Chem. Mater., 22, 635 (2010)
  4. Doo Seok Jeong, Reji Thomas, R.S. Katiyar, J.F. Scott, H. Kohlstedt, A. Petraru, Cheol Seong Hwang. Rep. Progr. Phys., 75, 076502 (2012)
  5. R.B. Jacobs-Gedrim, M.T. Murphy, F. Yang, N. Jain, M. Shanmugam, E. Sang Song, Y. Kandel, P. Hesamaddin, H. Yu Yu, M.P. Anantram, D.B. Janes, B. Yu. Appl. Phys. Lett., 112, 133101 (2018)
  6. J.J. Zhang, N. Liu, H.J. Sun, P. Yan, Y. Li, S.J. Zhong, S. Xie, R.J. Li, X.S. Miao. J. Electron. Mater., 45, 1154 (2016)
  7. Z. Lv, Y. Zhou, S.-T. Han, V.A.L. Roy. Materials Today, 21, 537 (2018)
  8. C. Du, W. Ma, T. Chang, P. Sheridan, W.D. Lu. Adv. Funct. Mater., 25, 4290 (2015)
  9. Y.V. Pershin, M. Di Ventra. Neural Netw., 23, 881 (2010)
  10. B. Lv, S. Hu, W.Li, X.Di, L. Feng, J. Zhang, L. Wu, Y. Cai, B. Li, Zh. Lei. Int. J. Photoenergy, 2010, Article ID 476589 (2010)
  11. Cheol-Min Park, Yoon Hwa, Nark-Eon Sung, Hun-Joon Sohn. J. Mater. Chem., 20, 1097 (2010)
  12. M.A. Popescu. Non-Crystalline Chalcogenicides (Springer, Solid-State Science and Technology Library, 2000). ISBN: 9780792366485.
  13. Wenwen Zheng, Peng Bi, Haochen Kang, Wei Wei, Fengming Liu, Jing Shi, Luxi Peng, Ziyu Wang, Rui Xiong. Appl. Phys. Lett., 105, 023901 (2014)
  14. G.J. Snyder, E.S. Toberer. Nature Mater., 7, 105 (2008)
  15. Y.K. Kuo, K.M. Sivakumar, C.A. Su, C.N. Ku, S.T. Lin, A.B. Kaiser, J.B. Qiang, Q. Wang, C. Dong. Phys. Rev. B, 74, 014208 (2006)
  16. V.V. Pryadun, D.V. Louzguine-Luzgin, L.V. Shvanskaya, A.N. Vasilieva. JETP Lett., 101, 465 (2015)
  17. Y.R. Guo, F. Dong, C. Qiao, J.J. Wang, S.Y. Wang, Ming Xu, Y.X. Zheng, R.J. Zhang, L.Y. Chen, C.Z. Wang, K.M. Ho. Phys. Chem. Chem. Phys., 20, 11768 (2018)
  18. A.A. Sherchenkov, S.A. Kozyukhin, P.I. Lazarenko, A.V. Babich, N.A. Bogoslovsky, I.V. Sagunova, E.N. Redichev. FTP, 51, 154 (2017) (in Russian)
  19. Yu.V. Khrapovitskaya, N.E. Maslova, M.L. Zanaveskin. Nauka i obrazovanie: nauch. izd. MGTU im. N.E. Baumana, 12, 329 (2013) (in Russian)
  20. B. Sun, Y. Chen, M. Xiao, G. Zhou, Sh. Ranjan, W. Hou, X. Zhu, Y. Zhao, S.A.T. Redfern, Y.N. Zhou. Nano Lett., 19, 6461 (2019)
  21. B. Sun, M. Xiao, G. Zhou, Z. Ren, Y.N. Zhou, Y.A. Wu. Mater. Today Adv., 6, 100056 (2020)

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru