Optical properties of silicon nanopillars with a built-in vertical p-n-junction
Basalaeva L. S. 1, Tsarev A. V. 1,2, Anikin K. V. 1, Veber S. L. 2,3, Kryzhanovskaya N. V. 4, Nastaushev Yu. V. 1
1Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk State University, Novosibirsk, Russia
3International Tomography Center, Siberian Branch of Russian Academy of Sciences, Novosibirsk, Russia
4Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg, Russia
Email: basalaeva@isp.nsc.ru, tsarev@isp.nsc.ru, kirill_anikin@list.ru, sergey.veber@tomo.nsc.ru, kryj@mail.ioffe.ru, nast@isp.nsc.ru

PDF
Resonance reflection of light from the ordered arrays of silicon nanopillars (Si NP) was investigated. The height of Si NP was 450 nm. The effect of Si NP oxidation in concentrated nitric acid on the position of resonances in reflection spectra was studied. A weak influence of the additional polymeric coating on the characteristics of reflection from the structures was proven. It is established on the basis of the results of experimental investigation and direct numerical modeling by means of three-dimensional finite difference time domain algorithm (3D FDTD) that the dependence of the resonant wavelength for Si NP on the diameter of Si NP is a linear function with nonzero displacement depending on the pitch. Keywords: silicon nanopillars, structural colors, all-dielectric nanophotonics.
  1. Yu. Kivshar. Natl. Sci. Rev., 5 (2) 144 (2018)
  2. Z.-J. Yang, R. Jiang, X. Zhuo, Y.-M. Xie, J. Wang, H.-Q. Lin. Phys. Rep., 701, 1 (2017)
  3. H. Bertin, Y. Br\^ule, G. Magno, T. Lopez, P. Gogo, L. Pradere, B. Gralak, D. Barat, G. Demesy, B. Dagens. ACS Photonics, 5 (7), 2661 (2018)
  4. S.I. Lepeshov, A.E. Krasnok, P.A. Belov, A.E. Miroshnichenko. Phys.-Usp., 61 (11), 1035 (2018)
  5. C. Zou, J. Sautter, F. Setzpfandt, I. Staude. J. Phys. D: Appl. Phys., 52, 373002 (2019)
  6. K.V. Baryshnikova, M.I. Petrov, V.E. Babicheva, P.A. Belov. Sci. Rept., 6, 22136 (1-11) (2016)
  7. A. Kuznetsov, A. Miroshnichenko, Y. Fu, J. Zhang, B. Luk'yanchuk. Sci. Rep., 2, 492 (2012)
  8. V.-C. Su, C.H. Chu, G. Sun, D.P. Tsai. Opt. Express, 26, 13148 (2018)
  9. M. Brongersma, Y. Cui, S. Fan. Nature Materials, 13, 451 (2014)
  10. A.L. Hernandez, R. Casquel, M. Holgado, I. Cornago, F. Fernandez, P. Ciaurriz, F.J. Sanza, B. Santamari a, M.V. Maigler, M. Fe Laguna. Optics Lett., 41 (23), 5430 (2016)
  11. V. Flauraud, M. Reyes, R. Paniagua-Domi nguez, A.I. Kuznetsov, J. Brugger. ACS Photonics, 4 (8), 1913 (2017)
  12. H. Li, S. Gao, Y. Li, C. Zhang, W. Yue. Opt. Express, 27 (24), 35027 (2019)
  13. C. Park, V.R. Shrestha, W. Yue, Song Gao, S.-S. Lee, E.-S. Kim, D.-Y. Choi. Sci. Rept., 7 (2556), 1-9 (2017)
  14. W. Yue, S. Gao, S.-S. Lee, E.-S. Kim, D.-Y. Choi. Laser Photonics Rev., 11 (3), 1600285 (2017)
  15. B.-H. Cheong, O.N. Prudnikov, E. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, S.T. Shin. Appl. Phys. Lett., 94, 213104, 1 (2009)
  16. X. Li, J. Li, T. Chen, B.K. Tay, J. Wang, H. Yu. Nanoscale Res. Lett., 5, 1721 (2010)
  17. S. Yalamanchili, H.S. Emmer, K.T. Fountaine, C.T. Chen, N.S. Lewis, H.A. Atwater. ACS Photonics, 3 (10), 1854 (2016)
  18. L.S. Basalaeva, Yu.V. Nastaushev, N.V. Kryzhanovskaya, E.I. Moiseev, D.A. Radnatarov, S.A. Khripunov, D.E. Utkin, I.B. Chistokhin, A.V. Latyshev, F.N. Dultsev. Thin Sol. Films, 672, 109 (2019)
  19. A. Smyrnakis, P. Dimitrakis, P. Normand, E. Gogolides. Microelectron. Eng., 174, 74 (2017)
  20. S. Tsoi, F.J. Bezares, A. Giles, J.P. Long, O.J. Glembocki, J.D. Caldwe, J. Owrutsky. Appl. Phys. Lett., 108, 11110 (1-5) (2016)
  21. N. Dhindsa, R. Kohandani, S.S. Saini. Nanotechnology, 31, 224001 (2020)
  22. L.S. Golobokova, Yu.V. Nastaushev, F.N. Dultsev, D.V. Gulyaev, A.B. Talochkin, A.V. Latyshev. J. Phys.: Conf. Ser., 541 (1), 012074 (2014)
  23. L.S. Basalaeva, Y.V. Nastaushev, F.N. Dultsev. Materials Today: Proceedings, 4 (11), 11341 (2017)
  24. Rsoft FullWave by SYNOPSYS. Photonic Design Software. https://www.synopsys.com/optical-solutions/rsoft.html
  25. Y. Yu, L. Cao. Opt. Express, 20, 13847 (2012)
  26. F.J. Bezares, J.P. Long, O.J. Glembocki, Junpeng Guo, R.W. Rendell, R. Kasica, L. Shirey, J.C. Owrutsky, J.D. Caldwell. Opt. Express, 21 (23), 27587 (2013).

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru