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The effect of layer thickness on the optical parameters of phase-change material Sb2Te3
Gavrikov A. A.
1, Kuznetsov V.G.
2, Dyad'kina N. E.1, Kolobov A. V.
1
1Institute of Physics, Herzen State Pedagogical University of Russia, 191186 St. Petersburg, Russia
2Ioffe Institute, St. Petersburg, Russia
2Ioffe Institute, St. Petersburg, Russia
Email: agavrikov@herzen.spb.ru, vladimir.kuznetsov@mail.ioffe.ru, akolobov@herzen.spb.ru
Antimony telluride (Sb2Te3) is one of the promising phase-change materials used in memory and data processing devices. Its layered structure allows for the fabrication of extremely thin layers with a thickness of about 1 nm. However, the issue of maintaining the contrast of properties between the amorphous and crystalline phases in extremely thin layers of Sb2Te3 has not yet been studied. In this study, the density functional theory calculations were used to perform a comparative analysis of the amorphous phase structure and optical property contrast for layers with a thickness of 1 ML, 2 ML and the bulk material. It was demonstrated that the optical property contrast is preserved down to 1 monolayer. Keywords: phase-change materials, Sb2Te3, monolayer, optical contrast, DFT method
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