Ankudinov A. V.
1, Vlasov A. S.1, Dunaevskiy M. S.1, Axenov V. Yu.1, Ilkiv I. V.2, Malevskaya A. V.1, Rodin V. D.1, Tschenin A. S.1, Mintairov A. M.1
1Ioffe Institute, St. Petersburg, Russia
2St. Petersburg State University, St. Petersburg, Russia
Email: alexander.ankudinov@mail.ioffe.ru, alex.ank@mail.ru, amalevskaya@mail.ioffe.ru
Using scanning Kelvin probe microscopy under room conditions, flickering of the surface potential signal over single 20-70 nm Au particles in the micro apertures of a perforated Au contact of a flat capacitor with the GaIn-pSi-SiO_2-Au structure was investigated. It was found that the flickering amplitude increases with decreasing particle size and probe-sample distance. The relationship between the flickering and thermal fluctuations of the particle potential, as well as other sources, was analyzed. Calibration of the surface potential signal on a nanoscale potential flicker source made it possible to identify the response to elementary charge jumps in the experimental data. Keywords: scanning probe microscopy, metallic nanoparticles, elementary electric charge, thermal noise.
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