Signatures of irradiation-induced defects in scanning-tunneling microscopy images of carbon nanotubes
Krasheninnikov A.V.1,2, Nordlund K.2
1Moscow State Engineering Physics Institute (Technical University), Moscow, Russia
2Accelerator Laboratory, University of Helsinki, FI Helsinki, Finland
Выставление онлайн: 17 февраля 2002 г.
Using empirical-potential and tight-binding models, we study the structure and stability of atomic-scale irradiation-induced defects on walls of carbon nanotubes. We model the temporal evolution of the defects and calculate their lifetimes at various temperatures. We further simulate scanning-tunneling microscopy (STM) images of irradiated nanotubes with the defects. Our simulations indicate that at low temperatures, the defects live long enough to be detected by STM and that different defects manifest themselves in STM images in different ways, which allows to distinguish the defects experimentally. The research was supported by the Academy of Finland under project Nos. 44215 and 73722.
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