Вышедшие номера
Spin-polarized scanning probe microscopy
Laiho R.1, Reittu H.1
1Wihuri Physical Laboratory, University of Turku, Turku, Finland
Поступила в редакцию: 6 декабря 1995 г.
Выставление онлайн: 18 февраля 1996 г.

Possibility of spin-polarized scanning probe microscopy using a semiconductor tip illuminated with circularly polarized light is theoretically discussed. Both spin-polarized scanning tunneling microscopy and spin-polarized force microscopy are considered. Critical evaluation of working conditions and tip materials suggest that they may provide means to investigate magnetic surface properties of solids with a very high resolution.