Field-effect transistor with graphene channel and epitaxial calcium fluoride layer as a gate dielectric
Illarionov Yu. Yu.1,2, Banshchikov A. G.1, Knobloch T.2, Ivanov I. A.1, Grasser T.2, Sokolov N. S.1, Vexler M. I. 1
1Ioffe Institute, St. Petersburg, Russia
2Institute of Microelectronics, Vienna University of Technology, Vienna, Austria
Email: vexler@mail.ioffe.ru

PDF
The samples of field-effect transistors for two-dimensional electronics using a combination of graphene (as a channel material) and epitaxial calcium fluoride (as a gate-insulating material), have been fabricated for the first time. Conventional measurements of terminal currents in these devices confirmed their functionality. The study can be treated as a step toward creation of the scalable transistors with the new promising materials. One of the nearest challenges is reduction of the sample-to-sample spread of the characteristics. Keywords: 2D electronics, field-effect transistor, graphene, calcium fluoride.
  1. M. Lemme, D. Akinwande, C. Huyghebaert, C. Stampfer, Nat. Commun., 13, 1392 (2022). DOI: 10.1038/s41467-022-29001-4
  2. A. Beraud, M. Sauvage, C. Bazan, M. Tie, A. Bencherif, D. Bouilly, Analyst, 146, 403 (2021). DOI: 10.1039/d0an01661f
  3. Yu.Yu. Illarionov, T. Knobloch, M. Jech, M. Lanza, D. Akinwande, M.I. Vexler, T. Mueller, M. Lemme, G. Fiori, F. Schwierz, T. Grasser, Nat. Commun., 11, 3385 (2020). DOI: 10.1038/s41467-020-16640-8
  4. F. Hui, M. Villena, W. Fang, A.-Y. Lu, J. Kong, Y. Shi, X. Jing, K. Zhu, M. Lanza, 2D Mater., 5, 031011 (2018). DOI: 10.1088/2053-1583/aac615
  5. M. Tsutsui, M. Watanabe, M. Asada, Jpn. J. Appl. Phys., 38 (8B), L920 (1999). DOI: 10.1143/JJAP.38.L920
  6. W. Hayes, Crystals with the fluorite structure (Clarendon Press, 1974)
  7. S. Miyamoto, H. Matsudaira, H. Ishizaka, K. Nakazawa, H. Taniuchi, H. Umezawa, M. Tachikia, H. Kawarada, Diamond Rel. Mater., 12, 399 (2003). DOI: 10.1016/S0925-9635(03)00034-7
  8. Yu.Yu. Illarionov, A.G. Banshchikov, D.K. Polyushkin, S. Wachter, T. Knobloch, M. Thesberg, M. Waltl, M. Stoeger-Pollach, A. Steiger-Thirsfeld, M.I. Vexler, N.S. Sokolov, T. Mueller, T. Grasser, Nat. Electron., 2, 230 (2019). DOI: 10.1038/s41928-019-0256-8
  9. A. Ishizaka, Y. Shiraki, J. Electrochem. Soc., 133, 666 (1986). DOI: 10.1149/1.2108651

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru