Measurement of distance by the maximum frequency of the interference signal with harmonic deviation of the wavelength of the self-mixing laser
Skripal An.V. 1, Добдин C.Ю.1, Inkin M.G. 1, Dzhafarov A.V. 1
1Saratov State University, Saratov, Russia
Email: skripalav@info.sgu.ru, sergant1986@yandex.ru

PDF
A method is proposed for measuring absolute distances from the low-frequency spectrum of the interference signal of a frequency-modulated laser diode. The method of modulation of the self-mixing laser signal according to the harmonic law is used, in the spectrum of which a wide range of frequency components is observed. The connection between the maximum frequency of change of the interference signal and the absolute distance to the reflector is shown. A linear dependence of the frequency corresponding to the inflection region of the decay envelope of the interference signal spectrum on the distance is shown, which can be used to implement a non-contact distance measurement method with harmonic modulation of the self-mixing laser supply current. Keywords: laser interferometry, self-mixing laser, semiconductor laser, laser radiation modulation, distance measurement, signal spectral analysis.
  1. A.P. Napartovich, A.G. Sukharev. Kvant. elektron., 34 (7), 630 (2004) (in Russian). V.Ya. Noskov, S.M. Smolsky. Radiotekhnika, 8, 91 (2013)
  2. H. Wang, Y. Ruan, Y. Yu, Q. Guo, J. Xi,, J. Tong. IEEE Access, 8, 123253 (2020). DOI: 10.1109/ACCESS.2020.3007516
  3. M.C. Amann, T. Bosch, M. Lescure, R. Myllyla, M. Rioux. Opt. Engineer., 40 (1), 10 (2001). DOI: 10.1117/1.1330700
  4. M. Norgia, A. Magnani, A. Pesatori. Rev. Sci. Instrum., 83 (4), 045113 (2012). DOI: 10.1063/1.3703311
  5. K. Ke, K. Kou, X. Li, L. Li, H. Xiang. Appl. Opt., 53 (27), 6280 (2014). DOI: 10.1364/AO.53.006280
  6. Z. Zhang, C. Li, Z. Huang. Opti. Commun., 436, 192 (2019). DOI: 10.1016/j.optcom.2018.12.032
  7. S. Donati. Laser Photon., 6 (3), 393 (2012). DOI: 10.1002/lpor.201100002
  8. S. Donati. Proceed. SPIE, 10150, 101501I (2016). DOI: 10.1117/12.2248912
  9. J. Chen, X. Wang, Y. Wu, Y. Yang, M. Qiu, M. Wang, Y. Li. Appl. Opt.,61, 4687 (2022). DOI: 10.1364/AO.455671
  10. F.F. Mul, M.H. Koelink, A.L. Weijers, J. Greve, J.G. Aarnoudse, R. Graaff, A.C.M. Dassel. Appl. Opt., 31 (27), 5844 (1992). DOI: 10.1364/AO.31.005844
  11. K. Meigas, H. Hinrikus, R. Kattai, J. Lass. J. Biomed. Opt., 8 (1), 152 (2003). DOI: 10.1117/1.1528949
  12. S.K. Ozdemir, S. Takamiya, S. Ito, S. Shinohara, H. Yoshida. IEEE Transactions on Instrument. Measurement, 49 (5), 1029 (2000). DOI: 10.1109/19.872925
  13. Z. Dong, X. Sun, W. Liu, H. Yang. Sensors, 18 (10), 3527 (2018). DOI: 10.3390/s18103527
  14. T. Wu, Y. Hui, Z. Yan, Z. Li, Q. Li. Opt. Laser Technol., 89, 196 (2017). DOI: 10.1016/j.optlastec.2016.09.034
  15. A.V. Skripal, S.Yu. Dobdin, A.V. Jafarov, K.A. Sadchikova, V.B. Feklistov. Izvestiya Saratovskogo universiteta Novaya seriya. Seriya: Fizika, 20 (2), 84 (2020) (in Russian). DOI: 10.18500/1817-3020-2020-20-2-84-91
  16. D.A. Usanov, A.V. Skripal, S.Yu. Dobdin, A.V. Jafarov, I.S. Sokolenko. Komp'yuternaya optika, 43 (5), 797 (2019) (in Russian). DOI: 10.18287/2412-6179-2019-43-5-796-802 D.A. Usanov, A.V. Skripal, S.Yu. Dobdin, E.I. Astakhov, I.Yu. Kostyuchenko, A.V. Jafarov. Izvestiya Saratovskogo universiteta Novaya seriya. Seriya: Fizika, 18 (3), 189 (2018) (in Russian)
  17. H. Olesen, J. H. Osmundsen, B. Tromborg. IEEE J. Quantum Electron., 22 (6), 762 (1986). DOI: 10.1109/JQE.1986.1073061
  18. N. Schunk, K. Petermann. IEEE J. Quantum Electron, 24 (7), 1242 (1988). DOI: 10.1109/3.960
  19. V.Ya. Noskov, S.M. Smolsky, K.A. Ignatkov, A.P. Chupakhin. Ural'skiy radiotekhnicheskiy zhurnal, 3 (1), 7 (2019). DOI: 10.15826/urej.2019.3.1.001
  20. G. Giuliani, M. Norgia, S. Donati, T. Bosch. J. Opt. A: Pure Appl. Opt., 4, 283 (2002). DOI: 10.1088/1464-4258/4/6/371

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru