Technical Physics

To authors

Volumes and Issues

2024
- 1 2 3 4 5 6 7 8 9 10 11
2023
- 1 2 3 4 5 6 7 8 9 10 11 12
2022
- 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Imaging system of a plasma torch of a Betatron X-ray source

DOI: 10.21883/TP.2022.08.54566.80-22

Antyushin E.S.¹, Akhsakhalyan A.A.¹, Zuev S.Yu.¹, Lopatin A.Ya.¹, Malyshev I.V.¹, Nachay A.N.¹, Perekalov A.A.¹, Pestov A.E.¹, Salashchenko N.N.¹, Toropov M.N.¹, Ulasevich B.A.¹, Tsybin N.N.¹, Chkhalo N.I.¹, Soloviev A.A.², Starodubtsev M.V.²

¹Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
²Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod, Russia

Email: aepestov@ipm.sci-nnov.ru

PDF

Abstract
References
Статистика просмотров

The paper describes the design of a microscope for studying a betatron radiation source based on the PEARL femtosecond laser complex in the SXR and EUV wavelength range. The main optical element of the microscope is a spherical Schwarzschild objective a x5 magnification. The device allows to study the size and spatial structure of the interaction area of laser radiation with matter, at a selected wavelength in the EUV or SXR range with a resolution of delta x=2.75 μm. The operation wavelength (λ=13.5 nm) is set by multilayer X-ray mirrors. Thin-film absorption filters are used to suppress the background component of the signal. Keywords: SXR and EUV radiation, betatron radiation, imaging x-ray optics, SXR microscope.

A.Ya. Faenov, J. Colgan, S.B. Hansen, A. Zhidkov, T.A. Pikuz, M. Nishiuchi, S.A. Pikuz, I.Yu. Skobelev, J. Abdallah, H. Sakaki, A. Sagisaka, A.S. Pirozhkov, K. Ogura, Y. Fukuda, M. Kanasaki, N. Hasegawa, M. Nishikino, M. Kando, Y. Watanabe, T. Kawachi, S. Masuda, T. Hosokai, R. Kodama, K. Kondo. Scientific Reports, 5, 13436 (2015)
I. Kostyukov, A. Pukhov, S. Kiselev. Phys. Plasmas, 11, 5256 (2004)
W. Lu, C. Huang, M. Zhou, W. Mori, T. Katsouleas. Phys. Rev. Lett., 96, 165002 (2006)
S. Kiselev, A. Pukhov, I. Kostyukov. Phys. Rev. Lett., 93, 135004 (2004)
S. Corde, K.Ta Phuoc, G. Lambert, R. Fitour, V. Malka, A. Rousse, A. Beck, E. Lefebvre. Rev. Mod. Phys., 85, 1 (2013)
J. Wenz, S. Schleede, K. Khrennikov, M. Bech, P. Thibault, M. Heigoldt, F. Pfeiffer, S. Karsch. Nature Commun., 6, 7568 (2015)
Zs. Lecz, A. Andreev, N. Hafz. Phys. Rev. E, 102, 053205 (2020). https://doi.org/10.1103/PhysRevE.102.053205
A.A. Soloviev et al. NIM A, 653, 35--41 (2011)
V.V. Lozhkarev G.I. Freidman, V.N. Ginzburg, E.V. Katin, E.A. Khazanov, A.V. Kirsanov, G.A. Luchinin, A.N. Mal'shakov, M.A. Martyanov, O.V. Palashov, A.K. Poteomkin, A.M. Sergeev, A.A. Shaykin, I.V. Yakovlev. Laser Phys. Lett., 4, 421 (2007)
[Electronic resource] Available at: www.zemax.com
I.G. Zabrodin, M.V. Zorina, I.A. Kas'kov, I.V. Malyshev, M.S. Mikhailenko, A.E. Pestov, N.N. Salashchenko, A.K. Chernyshev, N.I. Chkhalo. Tech. Phys., 65 (11), 1837--1845 (2020). DOI: 10.1134/S1063784220110274
[Electronic source] Available at: https://andor.oxinst.com/
[Electronic source] Available at: http://xray-optics.ru/products/software-multifitting/
S.S. Andreev, N.N. Salashchenko, L.A. Suslov, A.N. Yablonsky, S.Yu. Zuev. NIM A, 470 (1-2), 162--167 (2001)
S.A. Garakhin, N.I. Chkhalo, I.A. Kas'kov, A.Ya. Lopatin, I.V. Malyshev, A.N. Nechay, A.E. Pestov, V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, N.N. Tsybin, I.G. Zabrodin, S.Yu. Zuev. Rev. Sci. Instrum., 91 (6), 063103 (2020). DOI: 10.1063/1.5144489
N.I. Chkhalo, I.V. Malyshev, A.E. Pestov, V.N. Polkovnikov, N.N. Salashchenko, M.N. Toropov, A.A. Soloviev. Appl. Opt., 55 (3), 619--625 (2016)

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Institute Officers:

Contact us: