Post-growth technology of multi-junction photovoltaic converters based on A3B5 heterostructures
Malevskaya A. V.
1, Il'inskaya N. D.
1, Zadiranov Y. M.
1, Blokhin A. A.
1, Malevskii D. A.
1, Pokrovskii P. V.
11Ioffe Institute, St. Petersburg, Russia
Email: amalevskaya@mail.ioffe.ru, Natalia.Ilynskaya@mail.ioffe.ru, zadiranov@mail.ioffe.ru, bloalex@yandex.ru, dmalevsky@scell.ioffe.ru, P.Pokrovskiy@mail.ioffe.ru
Investigation and development of the post-growth technology for fabricating multi-junction photovoltaic converters based on GaInP/GaInAs/Ge heterostructure has been carried out. Antireflection coating, ohmic contacts and mesa-structure forming stages have been reviewed. The technology of n+-GaAs contact layer etching with the help of plasma-chemical, liquid and ion-beam etching has been investigated. Antireflection coefficient of radiation from the heterostructure with TiOx/SiO2 (x close to 2) antireflection coating surface was less then 3% in wavelength range 450-850 nm. The value of contact resistance for n- and p-type conductivity was 3·10-5-3·10-6 Ωcm2, the decrease of photosensitive region shading degree at increased bus-bar conductivity has been archived. The mesa-structure surface current leakage decreased to the value of 10-9 A at voltage less then 1 V. Keywords: photovoltaic converters, ohmic contacts, antireflection coating, mesa-structure
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