Technical Physics Letters
Volumes and Issues
Center-of-Mass Balanced Scanner for Scanning Probe Microscopy
Pichahchi S.V.1, Gorbenko O.M.1, Lukashenko S.Yu.1, Felshtyn M.L.1, Sapozhnikov I.D.1, Golubok A.O.1
1Institute for Analytical Instrumentation of the Russian Academy of Sciences, Saint Petersburg, Russia
Email: pichakhchi.s@yandex.ru

PDF
A method for damping the low-frequency resonance of the actuator in the feedback loop of a scanning probe microscope is presented. The method is based on center-of-mass balancing of the piezoelectric actuator combined with structural symmetrization of the scanner. Numerical modeling has been used to determine the optimal scanner design. Mounting the scanner to a rigid base in the plane of geometric symmetry of the housing suppresses the low-frequency resonance, enables an increase in the open-loop gain of the feedback system, and consequently improves the response speed of the tracking system without compromising its stability. Based on the modeling results, a scanner prototype was fabricated, and its frequency response was experimentally characterized. Good agreement between the calculated and experimental data has been obtained. The advantages of low-frequency resonance damping are demonstrated by imaging a test sample surface in scanning ion conductance microscopy operated in the hopping mode. Keywords: piezoelectric actuator, scanning speed, feedback control, center-of-mass balancing, scanning ion conductance microscopy.
  1. E.I. Yurevich, Teoriya avtomaticheskogo upravleniya, 3rd ed. (BKhV-Peterburg, SPb., 2007), pp. 122--126 (in Russian)
  2. N. Kodera, H. Yamashita, T. Ando, Rev. Sci. Instrum., 76 (5), 053708 (2005). DOI: 10.1063/1.1903123
  3. D.W. Pohl, IBM J. Res. Dev., 30 (4), 417 (1986). DOI: 10.1147/rd.304.0417
  4. S. Watanabe, S. Kitazawa, L. Sun, N. Kodera, T. Ando, Rev. Sci. Instrum., 90 (12), 123704 (2019). DOI: 10.1063/1.5118360
  5. S.V. Pichahchi, O.M. Gorbenko, S.Yu. Lukashenko, M.L. Felshtyn, I.D. Sapozhnikov, I.S. Svaikin, A.O. Golubok, Tech. Phys. Lett., 50 (10), 95 (2024). DOI: 10.61011/TPL.2024.10.59707.19984
  6. O.M. Gorbenko, S.Y. Lukashenko, S.V. Pichakhchi, I.D. Sapozhnikov, M.L. Felshtyn, A.O. Golubok, Nanosyst.: Phys., Chem., Math., 15 (5), 643 (2024). DOI: 10.17586/2220-8054-2024-15-5-643-653

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru