Technical Physics Letters
Volumes and Issues
Home » Technical Physics Letters » Year 2026, issue 2 » Article p. 91
<<<>>>
Nexafs study of the O2-Yb-Si(111) nanofilm system
Russian version
Kuzmin M. V. 1, Remele V. E. 1, Sorokina S. V. 1, Chumakov R. G.
1Ioffe Institute, St. Petersburg, Russia
Email: m.kuzmin@mail.ioffe.ru
PDF
The near-edge X-ray absorption fine structure of the adsorbed oxygen layer on the ytterbium nanofilm has been studied. It is shown that oxygen is chemisorbed in the form that is close to singly charged O2- ions. The O-O bond length in such ions is determined (1.33 Angstrem). X-ray dichroism of chemisorbed molecules is detected. It is due to the orientation of intramolecular σ* orbitals predominantly along the normal to the ytterbium surface. Keywords: X-ray absorption, near-edge fine structure, nanoadsorbent, chemisorption, oxygen, ytterbium.
  1. T.A. Saleh, Surface science of adsorbents and nanoadsorbents. Ser. Interface Science and Technology (Academic Press, London, 2022), vol. 34
  2. Synthesis and modification of nanostructured thin films, ed. by I.N. Mihailescu (MDPI, Basel, 2020)
  3. A. Kasprzak, M. Matczuk, H. Sakurai, Chem. Commun., 59, 9591 (2023). DOI: 10.1039/d3cc02657d
  4. D.V. Buturovich, M.V. Kuz'min, M.V. Loginov, M.A. Mittsev, Phys. Solid State, 57 (9), 1870 (2015). DOI: 10.1134/S1063783415090061
  5. M.V. Kuz'min, M.A. Mittsev, Tech. Phys., 66, 987 (2021). DOI: 10.1134/S1063784221070070
  6. M.V. Kuzmin, M.A. Mittsev, V.E. Remele, S.V. Sorokina, Tech. Phys. Lett., 50 (9), 61 (2024). DOI: 10.61011/TPL.2024.09.59157.19898
  7. G. Adachi, N. Imahaka, Chem. Rev., 98, 1479 (1998). DOI: 10.1021/cr940055h
  8. J. Stohr, NEXAFS spectroscopy. Springer Ser. in Surface Science (Springer, Berlin-Heidelberg, 1996), vol. 25
  9. R.C Couto, L. Kjellsson, H. Angstrem gren, V. Carravetta, S.L. Sorensen, M. Kubin, C. Bulow, M. Timm, V. Zamudio-Bayer, B. von Issendorff, J.T. Lau, J. Soderstrom, J.-E. Rubensson, R. Lindblad, Phys. Chem. Chem. Phys., 22 (28), 16215 (2020). DOI: 10.1039/d0cp02207a
  10. X. Sun, X. Chen, C. Fu, Q. Yu, X.-S. Zheng, F. Fang, Y. Liu, J. Zhu, W. Zhang, W. Huang, Nature Commun., 13, 6677 (2022). DOI: 10.1038/s41467-022-34563-4
  11. W. Wurth, J. Stohr, P. Feulner, X. Pan, K.R. Bauchspiess, Y. Baba, E. Hudel, G. Rocker, D. Menzel, Phys. Rev. Lett., 65, 2426 (1990). DOI: 10.1103/PhysRevLett.65.2426
  12. A.M. Lebedev, K.A. Menshikov, V.G. Nazin, V.G. Stankevich, M.B. Tsetlin, R.G. Chumakov, J. Surf. Investig., 15 (5), 1039 (2021). DOI: 10.1134/S1027451021050335
  13. M.V. Kuz'min, M.A. Mittsev, Tech. Phys., 65 (8), 1307 (2020). DOI: 10.1134/S1063784220080125
  14. M.V. Kuz'min, M.A. Mittsev, Phys. Solid State, 52 (6), 1279 (2010). DOI: 10.1134/S1063783410060259
  15. A.P. Conde, R. Montero, V. Ovejas, M. Fernandez-Fernandez, F. Castano, A. Longarte, Phys. Chem. Chem. Phys., 15, 4914 (2013). DOI: 10.1039/c3cp44380a
  16. D.A. Outka, J. Stohr, W. Jark, P. Stevens, J. Solomon, R.J. Madix, Phys. Rev. B, 35, 4119 (1987). DOI: 10.1103/physrevb.35.4119
  17. H.B. Gray, Electrons and chemical bonding (W.A. Benjamin, Inc., N.Y.-Amsterdam, 1965)
  18. C.M. Kim, H.S. Jeong, E.H. Kim, Surf. Sci., 459, L457 (2000). DOI: 10.1016/S0039-6028(00)00512-4
  19. J. Marsden, L.S. Bartell, P. Diodati, J. Mol. Struct., 39, 253 (1977). DOI: 10.1016/0022-2860(77)85095-3
  20. E. Ruhl, A.P. Hitchcock, Chem. Phys., 154, 323 (1991). DOI: 10.1016/0301-0104(91)80082-S
Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru