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Change in the rotation speed of the crystal lattice in spherulitic thin films with increasing their thickness
Russian version
Pronin I. P. 1, Kaptelov E. Yu. 1, Senkevich S. V. 1, Staritsyn M. V. 2, Pronin V. P. 3, Nemov S. A. 4
1Ioffe Institute, St. Petersburg, Russia
2Central Research Institute of Structural Materials Prometey, National Research Centre Kurchatov Institute, St. Petersburg, Russia
3Herzen State Pedagogical University of Russia, St. Petersburg, Russia
4Peter the Great Saint-Petersburg Polytechnic University, St. Petersburg, Russia
Email: Petrovich@mail.ioffe.ru, kaptelov@mail.ioffe.ru, Senkevichsv@mail.ioffe.ru, ms_145@mail.ru, pronin.v.p@yandex.ru, nemov_s@mail.ru
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The thickness dependence of the lattice rotation rate (gradient) in submicron spherulitic films of lead zirconate titanate (PZT) was studied using the electron backscatter diffraction method. Analysis of the lattice rotation rate dependence on the thickness showed that a decrease in the PZT layer thickness leads to the appearance of plastic deformation; the mechanisms of its formation are discussed. Keywords: spherulitic microstructure, lead zirconate titanate thin films, rotational crystals, electron backscatter diffraction.
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