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Experimental determination of residual strains and stresses in 2G HTS wire
Russian version
A.V. Irodova1, I.D. Karpov1, O.A. Kondratiev1, V.S. Kruglov1, V.E. Krylov1, S.V. Shavkin1, V.T. Em1
1National Research Center “Kurchatov Institute”, Moscow, Russia
Email: Irodova_AV@nrcki.ru
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Using X-ray and neutron diffraction, residual strains and stresses were measured in the main components of the second generation high temperature superconducting (2G HTS) wire based on yttrium ceramics, which was produced at the National Research Center "Kurchatov Institute" - in the stainless steel carrier tape, Y0.15Zr0.85O2 and CeO2 buffer layers, and the YBa2Cu3O7 superconducting layer. Their changes during the wire manufacturing process were traced. The reliability of the results obtained is confirmed by their consistency. The method presented in the work for determining internal strain and stress is universal and is suitable for wires with different carrier tapes, buffer and superconducting layers. Keywords: 2G HTS, residual strain/stress, AISI 310S tape, YSZ, CeO2, YBCO, X-ray diffraction, neutron diffraction.
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