Technical Physics Letters
To authors
Volumes and Issues
- 2025
- 2024
- 2023
- 2022
Multiphoton microscopy as a way to control the purification efficiency of silicon filamental nanocrystals
Lemeshko P. S.
1, Kondratev V. M.
2,3, Vyacheslavova E. A.
3, Moshnikov V. A.
1
1St. Petersburg State Electrotechnical University “LETI", St. Petersburg, Russia
2Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
3Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg, Russia
2Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
3Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg, Russia
Email: lemeshkops@yandex.ru
Multiphoton microscopy is a promising method for controlling the degree of contamination and purification efficiency in solid-state structures and microstructures. It has been demonstrated that, unlike conventional scanning laser microscopy techniques, multiphoton microscopy provides information about the localization of contaminants on silicon filamentary nanocrystal structures and enables qualitative evaluation of their purification level after cleaning procedures. Keywords: Two-photon microscopy, two-photon photoluminescence, filamentary nanocrystals, silicon.
- C.J.R. Sheppard, J. Biomed. Opt., 25 (1), 014511 (2020). DOI: 10.1117/1.JBO.25.1.014511
- M.J. Sanderson, I. Smith, I. Parker, M.D. Bootman, Cold Spring Harb. Protoc., 2014 (10), 1042 (2014). DOI: 10.1101/pdb.top071795
- H. Lin, T. Fan, J. Sui, G. Wang, J. Chen, S. Zhuo, H. Zhang, Nanoscale, 11 (42), 19619 (2019). DOI: 10.1039/C9NR04902A
- G. Borile, D. Sandrin, A. Filippi, K.I. Anderson, F. Romanato, Int. J. Mol. Sci., 22 (5), 2657 (2021). DOI: 10.3390/ijms22052657
- P.S. Lemeshko, Y.M. Spivak, V.A. Moshnikov, Nanobiotechnol. Rep., 18 (S1), 203 (2023). DOI: 10.1134/S2635167623600670
- P.S. Lemeshko, A.Yu. Gagarina, L.S. Bogoslovskaya, Y.M. Spivak, V.A. Moshnikov, in 2022 Conf. of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) (IEEE, 2022), p. 982-985. DOI: 10.1109/ElConRus54750.2022.9755668
- M. Ciappina, A.A. Chacon S., M. Lewenstein, in Springer Handbook of Atomic, Molecular, and Optical Physics, ed. by G.W.F. Drake (Springer, Cham, 2023), p. 1125-1140. DOI: 10.1007/978-3-030-73893-8_78
- V.M. Kondratev, E.A. Vyacheslavova, T. Shugabaev, D.A. Kirilenko, A. Kuznetsov, S.A. Kadinskaya, Z.V. Shomakhov, A.I. Baranov, S.S. Nalimova, V.A. Moshnikov, A.S. Gudovskikh, A.D. Bolshakov, ACS Appl. Nano Mater., 6 (13), 11513 (2023). DOI: 10.1021/acsanm.3c01545
- M. Garin, J. Heinonen, L. Werner, T.P. Pasanen, V. Vahanissi, A. Haarahiltunen, M.A. Juntunen, H. Savin, Phys. Rev. Lett., 125 (11), 117702 (2020). DOI: 10.1103/PhysRevLett.125.117702
- V.A. Georgobiani, K.A. Gonchar, E.A. Zvereva, L.A. Osminkina, Phys. Status Solidi A, 215 (1), 1700565 (2018). DOI: 10.1002/pssa.201700565
- V.M. Kondratev, I.A. Morozov, E.A. Vyacheslavova, D.A. Kirilenko, A. Kuznetsov, S.A. Kadinskaya, S.S. Nalimova, V.A. Moshnikov, A.S. Gudovskikh, A.D. Bolshakov, ACS Appl. Nano Mater., 5 (7), 9940 (2022). DOI: 10.1021/acsanm.2c02178
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.