Investigation of the properties of multilayer mirrors based on a pair of materials Mo/B4C
Shaposhnikov R. A.1, Garakhin S. A. 1, Durov K. V. 1, Polkovnikov V. N. 1, Chkhalo N. I. 1
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: shaposhnikov-roma@mail.ru
The properties of Mo/B4C multilayer X-ray mirrors with periods of 3.74-3.84 nm are studied in this work. The dependences of the transmission band, reflection coefficient and the magnitude of internal stresses in mirrors on the ratio of material thicknesses in the period were investigated. The results of a study of the effect of thermal annealing on the structural parameters and reflective characteristics of mirrors are also presented in the paper. Keywords: multilayer X-ray mirrors, synchrotron applications, X-ray monochromators. DOI: 10.61011/TP.2023.07.56629.77-23
- S.V. Rashchenko, M.A. Skamarokha, G.N. Baranov, Y.V. Zubavichus, I.V. Rakshun. AIP Conf. Proc., 2299, 060001 (2020). DOI: 10.1063/5.0030346
- N.I. Chkhalo, S.A. Garakhin, I.V. Malyshev, V.N. Polkovnikov, M.N. Toropov, N.N. Salashchenko, B.A. Ulasevich, Ya.V. Rakshun, V.A. Chernov, I.P. Dolbnya, S.V. Raschenko. ZhTF, 92 (8), 1261 (2022) (in Russian). DOI: 10.21883/JTF.2022.08.52794.100-22
- S.S. Andreev, M.S. Bibishkin, N.I. Chkhalo, E.B. Kluenkov, K.A. Prokhorov, N.N. Salashchenko, M.V. Zorina, F. Schafers, L.A. Shmaenok. J. Synchrotron Radiation, 10 (5), 358 (2003). DOI: 10.1107/s0909049503015255
- M. Barthelmess, S. Bajt. Appl. Opt., 50 (11), 1610 (2011). DOI: 10.1364/AO.50.001610
- J. Zhu, B. Ji, J. Zhu, H. Jiang, S. Zhu, M. Li, J. Zhang. Mater. Res. Express, 7 (3), 036403 (2020). DOI: 10.1088/2053-1591/ab7c87
- F. Choueikani, F. Bridou, B. Lagarde, E. Meltchakov, F. Polack, P. Mercere, F. Delmotte. Appl. Phys. A, 111, 191 (2013). DOI: 10.1007/s00339-013-7560-3
- M. Niibe, H. Nii, Y. Sugie. Jpn. J. Appl. Phys., 41, 3069 (2002). DOI: 10.1143/JJAP.41.3069
- A.F. Jankowski, P.L. Perry. Thin Solid Films, 206, 365 (1991). DOI: 10.1016/0040-6090(91)90452-4
- M. Barthelmess, S. Bajt. Proc. SPIE, 8077, 807710 (2011). DOI: 10.1117/12.886751
- I.G. Zabrodin, B.A. Zakalov, I.A. Kaskov, E.B. Klyuenkov, V.N. Polkovnikov, N.N. Salashchenko, S.D. Starikov, L.A. Suslov. Poverkhnost. Rentgenovskie, sinkhrotronnye i nejtronnye issledovaniya, 7, 37 (2013) (in Russian). DOI: 10.7868/S0207352813070202
- M. Svechnikov, D. Pariev, A. Nechay, N. Salashchenko, N. Chkhalo, Y. Vainer, D. Gaman. J. Appl. Cryst., 50, 1428 (2017). DOI: 10.1107/S1600576717012286
- M. Svechnikov, J. Appl. Crystallogr., 53 (1), 244 (2020). DOI: 10.1107/S160057671901584X
- S.S. Andreev, A.D. Akhsakhalyan, M.A. Bibishkin, N.I. Chkhalo, S.V. Gaponov, S.A. Gusev, E.B. Kluenkov, K.A. Prokhorov, N.N. Salashchenko, F. Schafers, S.Yu. Zuev. Centr. Europ. J. Phys., 1, 191 (2003). DOI: 10.2478/BF02475561
- A. Kazimirov, D.-M. Smilgies, Q. Shen, X. Xiao, Q. Hao, E. Fontes, D.H. Bilderback, S.M. Gruner, Y. Platonov, V.V. Martynovb. J. Synchrotron Radiation, 13 (2), 204 (2006). DOI: 10.1107/S0909049506002846
- N.P. Cowieson, C.J.C. Edwards-Gayle, K. Inoue, N.S. Khunti, J. Doutch, E. Williams, S. Daniels, G. Preece, N.A. Krumpa, J.P. Sutter, M.D. Tully, N.J. Terrilla, R.P. Ramboa. J. Synchrotron Radiation, 27 (5), 1438 (2020). DOI: 10.1107/S1600577520009960
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.