Technical Physics Letters
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- 2023
- 2022
Low-energy ion scattering with additional mass separation: instrumentation and application
Tolstoguzov A. B.
1,2,3, Gusev S. I. 1, Fu D. J.3
1Ryazan State Radio Engineering University, Ryazan, Russia
2Center for Physics and Technological Research, Universidade Nova de Lisboa, Caparica, Portugal
3Key Laboratory of Artificial Micro- and Nanostructures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology, Wuhan University, Wuhan, China
2Center for Physics and Technological Research, Universidade Nova de Lisboa, Caparica, Portugal
3Key Laboratory of Artificial Micro- and Nanostructures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology, Wuhan University, Wuhan, China
Email: a.tolstoguzov@fct.unl.pt
Hardware implementation and application of the combined energy and mass spectrometric analysis of backscattered and sputtered ions are discussed. For a ternary jewelry alloy contained Au, Ag and Cu, it was shown that this method is able improving analytical sensitivity by suppressing the background related to sputtered ions, and with heavy Ar+ ions to obtain information on the surface condition of a lanthanum sample and to detect backscattered and sputtered Ar2+ ions on this surface. Keywords: ion scattering, ion sputtering, mass spectrometric analysis, energy spectra, lanthanum
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