The features of the layers growth in stressed InAs/GaSb superlattices
Levin R.V.1, Nevedomskiy V. N. 1, Sokura L.A. 1
1Ioffe Institute, St. Petersburg, Russia
Email: Lev@vpegroup.ioffe.ru, nevedom@mail.ioffe.ru, sokuraliliy@mail.ru

PDF
The paper presents the results of a study of factors affecting the thickness of transition (interface) layers in stressed InAs/GaSb superlattices during growth by MOCVD method. It is shown that the thicknesses of the interface layers between InAs and GaSb are practically independent of the growth temperature. The thickness of the interface layers is influenced by the direction of switching the layer growth. The smallest thickness of 1.2-1.4 nm of the interface layer InAs/GaSb was obtained for the direction of growth switching from GaSb to InAs. Keywords: MOCVD, stressed superlattice, InAs/GaSb, interface layer, transmission electron microscopy.
  1. C.H. Grein, P.M. Young, H. Ehrenreich, Appl. Phys. Lett., 61 (24), 2905 (1992). DOI: 10.1063/1.108480
  2. D.L. Smith, C. Mailhiot, J. Appl. Phys., 62 (6), 2545 (1987). DOI: 10.1063/1.339468
  3. M. Razeghi, B.-M. Nguyen, Rep. Prog. Phys., 77, 082401 (2014). DOI:10.1088/0034-4885/77/8/082401
  4. A. Rogalski, P. Martyniuk, M. Kopytko, Appl. Phys. Rev., 4 (3), 031304 (2017). DOI: 10.1063/1.4999077
  5. J. Wu, Z. Xu, J. Chen, L. He, Infrared Phys. Technol., 92, 18 (2018). DOI: 10.1016/j.infrared.2018.05.004
  6. M.K. Hudait, M. Clavel, P.S. Goley, Y. Xie, J.J. Heremans, Y. Jiang, Z. Jiang, D. Smirnov, G.D. Sanders, C.J. Stanton, Mater. Adv., 1 (5), 1099 (2020). DOI: 10.1039/D0MA00046A
  7. X. Li, J. Cui, Y. Zhao, Q. Wu, Y. Teng, X. Hao, Y. Chen, J. Liu, H. Zhu, Y. Huang, Y. Yao, J. Appl. Phys., 127 (4), 045305 (2020). DOI: 10.1063/1.5115269
  8. G.B. Stringfellow, Organometallic vapor-phase epitaxy, 2nd ed. (Academic Press, London-N.Y., 1999), p. 260

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru