Rubidium-based multilayer mirrors for soft X-ray radiation
M.A. Yamschikova1,2, V.G. Rogachev1, A.P. Shkurinov2
1Institute of Laser Physics Research, RFNC-VNIIEF, Sarov, Russia
2Faculty of Physics and branch in Sarov, Lomonosov Moscow State University, Sarov, Russia
Email: ya_maria94@mail.ru

PDF
Theoretical study was performed to investigate the configuration of rubidium-based X-ray multilayer mirrors for a wavelength range of 11-17 nm. A genetic algorithm was used to solve the problem of multilayer configuration improvement for such mirrors. A possibility of reaching a maximum theoretical reflectivity limit of 78 % for Ru/Rb-mirrors at 13.5 nm and of 83 % for Al/Rb-mirrors near 17.0-17.1 nm is justified. Keywords: X-ray radiation, multilayer metal mirrors, refractive index, reflectivity, spectral selectivity, genetic algorithm.
  1. B.L. Henke, E.M. Gullikson, J.C. Davis. Atomic Data and Nuclear Data Tables, 54 (2), 181 (1993)
  2. A. Michette. Optika myagkogo rentgenovskogo izlucheniya (Mir, M., 1989) (in Russian)
  3. N. Chkhalo, S. Gusev, A. Nechay, D. Pariev, V. Polkovnikov, N. Salashchenko, F. Schafers, M. Sertsu, A. Sokolov, M. Svechnikov, D. Tatarsky. Opt. Lett., 42 (24), 5070 (2017). DOI: https://doi.org/10.1364/OL.42.005070
  4. Yu.A. Weiner, S.A. Garakhin, S.Yu. Zuev, A.N. Nechai, R.S. Pleshkov, V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, M.G. Sertsu, R.M. Smertin, A. Sokolov, N.I. Chkhalo, F. Shafers. Poverkhnost'. Rentgenovskie, sinhrotronnye i neitronnye issledovaniya 2, 3 (2020) (in Russian). DOI: 10.31857/S1028096020020168
  5. V.N. Polkovnikov, R.A. Shaposhnikov, N.I. Chkhalo, N.N. Salashchenko, N.A. Dyuzhev, F.A. Pudonin, G.D. Demin. Kratkie soobshcheniya po fizike FIAN, 12, 58 (2021) (in Russian)
  6. R.A.Shaposhnikov, S.Yu.Zuev, V.N.Polkovnikov, N.N.Salashchenko, N.I.Chkhalo. ZhTF, 92 (8), 1179 (2022) (in Russian). DOI: 10.21883/JTF.2022.08.52780.124-22
  7. S.V. Kuzin, A.A. Reva, S.A. Bogachev, N.F. Erkhova, N.N. Salashchenko, N.I. Chkhalo, V.N. Polkovnikov. ZhTF, 90 (11), 1817 (2020) (in Russian). DOI: 10.21883/JTF.2020.11.49967.113-20
  8. N.I. Chkhalo, D.E. Pariev, V.N. Polkovnikov N.N. Salashchenko, R.A. Shaposhnikov, I.L. Stroulea, M.V. Svechnikov, Yu.A. Vainer, S.Yu. Zuev. Thin Solid Films, 631, 106 (2017). DOI: 10.1016/j.tsf.2017.04.020
  9. A.D. Akhsakhalyan, E.B. Klyuenkov, A.Ya. Lopatin, V.I. Luchin, A.N. Nechai, A.E. Pestov, V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, M.N. Toropov, N.N. Tsybin, N.I. Chkhalo, A.V. Shcherbakov. Poverkhnost'. Rentgenovskie, sinhrotronnye i neitronnye issledovaniya 1, 5 (2017) (in Russian)
  10. V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, N.I. Chkhalo. YFN, ser. "Konferentsii i simpoziumy", 190 (1), 92 (2020) (in Russian) DOI: https://doi.org/10.3367/UFNr.2019.05.038623
  11. E.A. Vishnyakov, D.L. Voronov, E.M. Gullikson, V.V. Kondratenko, I.A. Kopylets, M.S. Luginin, A.S. Pirozhkov, E.N. Ragozin, A.N. Shatokhin. Kvant. elektron., 43 (7), 666 (2013) (in Russian)
  12. R.A.Shaposhnikov, S.Yu.Zuev, V.N.Polkovnikov, N.N.Salashchenko, N.I.Chkhalo, F. Delmotte, E. Meltchakov. ZhTF, 89 (11), 1774 (2019) (in Russian). DOI: 10.21883/JTF.2019.11.48343.129-19
  13. E.A. Vishnyakov, F.F. Kamenets, V.V. Kondratenko, M.S. Luginin, A.V. Panchenko, Yu.P. Pershin, A.S. Pirozhkov, E.N. Ragozin. Kvant. elektron. (in Russian), 42 (2), 143 (2012)
  14. T.V. Panchenko. Geneticheskie algoritmy: uchebno-metodicheskoe posobie (Izdat. dom "Astrakhansky universitet", Astrakhan, 2007) (in Rissian)
  15. M.M. Barysheva, S.A. Garakhin, S.Yu. Zuev, V.N. Polkovnikov. N.N. Salashchenko, M.V. Svechnikov, R.M.Smertin, N.I. Chkhalo, E. Meltchakov. ZhTF, 89 (11), 1763 (2019). DOI: 10.21883/JTF.2022.08.52770.118-22
  16. S.A. Garakhin, A.Ya. Lopatin, A.N. Nechay, A.A. Perekalov, A.E. Pestov, N.N. Salashchenko, N.N. Tsybin, N.I. Chrhalo. ZhTF, 93 (7), 1002 (2023) (in Russian). DOI: 10.21883/JTF.2023.07.55760.60-23
  17. Yu.A. Novikova. Avtoref. kand. diss. (Gos. un-t aerokosmicheskogo proborostroeniya, SPb., 2015) (in Russian)
  18. F. Abeles. Ann. Phys., 3 (4), 504 (1948)
  19. Born, E. Volf, Osnovy optiki (Nauka, M., 1970), p. 720 (in Russian)
  20. P.H. Berning. Teoriya i metody rascheta opticheskikh svoistv tonkikh. Sb. fizika tonkikh plenok (Mir, M., 1967) [Pod. obshch. red. G. Hassa n R.E. Tauna; perevod c angl. pod. red. V.B. Sandomirskogoi A.G. Zhdana] (in Russian)
  21. N. Kaiser, S. Yulin, M. Perske, T. Feigl. Proceedings in SPIE, 7101, 71010Z-1 (2008). DOI: 10.1117/12.796150
  22. S. Bajt, J.B. Alameda, T. Barbee, W.M. Clift. Proceedings in SPIE, Optical Engineering, 41 (8), 1797 (2002). DOI: 10.1117/1.1489426
  23. M. Saedi, C. Sfiligoj, J. Verhoeven, J.W.M. Frenkena. Appl. Surf. Sci., 507, 1 (2020). DOI: https://doi.org/10.1016/j.apsusc.2019.144951
  24. E. Louis, A.E. Yakshin, P.C. Gorts, S. Oestreich, R. Stuik, M.J.H. Kessels, E.L.G. Maas, F. Bijkerk, M. Haidl, S. Muellender, M. Mertin, D. Schmitz, F. Scholze, G. Ulm. Proc. SPIE, 3997, (2000). DOI: 10.1117/12.390077
  25. S.A. Yulin, I.V. Kozevnikov, S.I. Sagitov, V.A. Chirkov, V.E. Levashov, A.V. Vinogradov. Appl. Opt., 32 (10), 1811 (1993).

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru