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Electron beam diagnostics using hard X-rays at the SRF SKIF"
Russian version
Khomyakov Yu.V. 1,2, Meshkov O.I.2, Nazmov V.P.2,3, Rakshun Ya.V. 2,4, Chernov V. A.2, Chkhalo N.I.5
1SRF "SKIF", Koltsovo, Russia
2 Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
3Institute of Solid State Chemistry and Mechanochemistry, Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia
4Sobolev Institute of Geology and Mineralogy, Siberian Branch Russian Academy of Sciences, Novosibirsk, Russia
5Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: yu.v.khomyakov@yandex.ru
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This paper briefly describes some methods for measuring ultra-low emittance of an electron beam using hard X-rays. It is shown that a combination of diagnostic methods eliminates the influence of errors introduced by individual X-ray optical components. Modeling of radiation beams has been performed in accordance with the proposed schemes for measuring emittance. For the most conservative scheme, a pinhole camera, achievable resolution is estimated to be 3.7 μm. An optical design for a specialized diagnostic beamline of the SRF "SKIF" has been proposed. Keywords: synchrotron radiation, hard X-rays, electron emittance, pinhole, speckle pattern, Billet lens, Young experiment, Young interferometer, Billet interferometer, pinhole camera, Kirkpatrick-Baez mirrors.
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