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Method for extraction of frequency-dependent attenuation and coupling coefficients of optical microring resonator coupled with straight waveguide
Russian version
Nikitin A. A. 1, Chekmezov K. N.1, Ershov A. A. 1, Semenov A. A. 1, Ustinov A. B. 1
1St. Petersburg State Electrotechnical University “LETI", St. Petersburg, Russia
Email: aanikitin@etu.ru
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An original non-destructive characterization method of basic components of photonic integrated circuits in a wide frequency range is proposed. The method allows extracting a frequency-dependent coupling coefficient of the microring resonator with a straight waveguide, as well as the attenuation coefficient, group refractive index and dispersion coefficient of rectangular optical waveguide from the measured transmission characteristics of the microring resonator serving as a test element. An efficiency of the proposed characterization method is demonstrated for photonic integrated circuits fabricated by a silicon-on-insulator technology in the frequency range of 184-197 THz (which corresponds to the wavelength range of 1520-1630 nm). Obtained waveguide parameters are used for modeling the transmission characteristics of the photonic integrated circuits that are in good agreement with experimental data. Keywords: photonic integrated circuits, optical waveguides, silicon-on-insulator, non-destructive characterization methods.
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