Investigation of the composition of samarium monosulfide films obtained by electron beam heating
Baskakov E. B.
1, Strelov V. I.
11Shubnikov Institute of Crystallography “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia
Email: baskakov.ras@gmail.com
The elemental composition of thin films obtained by electron beam heating of bulk SmS samples with a different element ratio: 1Sm : 1S, 1.05Sm : 1S and 1.15Sm : 1S. has been studied by energy dispersive spectroscopy. The analysis of elemental composition before and after spraying on the substrate was carried out on a volume sample of the composition 1.15Sm : 1S. According to the microanalysis data, a change in the content of elements was established and an assessment of the change in the phase composition in the sprayed material was made. It is shown that the composition of the obtained thin films contains an excessive Sm content. A method for determining the inhomogeneity of the composition in depth for SmS films is proposed, in which, using a two stream model of charged particle transport, the dependence of the electron beam path on the primary electron energy in SmS for energies up to 30 keV is calculated. Keywords: electron beam heating, samarium monosulfide, energy dispersive X-ray analysis (EDAX), transport length of a monoenergetic electron beam in a sample.
- A.V. Golubkov, E.V. Goncharova, V.P. Zhuze, G.M. Loginov, V.M. Sergeeva, I.A. Smirnov. Fizicheskie svoistva khalkogenidov RZE (Nauka, L., 1973)
- A.V. Golubkov, V.M. Sergeeva. ZhVKhO, 2 (6), 645 (1981).(in Russian)
- R. Keller, G. Guntherodt, W.B. Holzapfel, M. Dietrich, F. Holtzberg. Solid State Commun., 29, 753 (1979). DOI: 10.1016/0038-1098(79)90154-6
- O.V. Andreev, V.V. Ivanov, A.V. Gorshkov, P.V. Miodushevskiy, P.O. Andreev. Eurasian Chemico-Technol. J., 18 (1), 55 (2016). DOI: 10.18321/ectj396
- V.V. Kaminskii, A.A. Molodykh, I.S. Polukhin, S.M. Solov'ev, K.V. Shuraev. Tech. Phys. Lett., 40 (6), 453 (2014). DOI: 10.1134/S1063785014060066
- L. Li, S. Hirai, Y. Tasaki. J. Rare Earths, 34 (10), 1042 (2016). DOI: 10.1016/S1002-0721(16)60132-1
- V.V. Kaminskiy, N.N. Stepanov, A.A. Molodykh. Physics Solid State, 52 (7), 1356 (2010). DOI: 10.1134/S106378341007005X
- V.V. Kaminskiy, V.A. Sidorov, N.N. Stepanov, M.M. Kazanin, A.A. Molodykh, S.M. Solov'ev. Physics Solid State, 55 (2), 293 (2013) DOI: 10.1134/S106378341302011X
- I.A. Pronina, N.D. Yakushova, D.Ts. Dimitrov, L.K. Krasteva, K.I. Papazova, A.A. Karmanov, I.A. Averin, A.Ts. Georgieva, V.A. Moshnikov, E.I. Terukov. Tech. Phys. Lett., 43 (9), 825 (2017). DOI: 10.1134/S1063785017090255
- V.V. Kaminskii, S.M. Solov'ev, N.V. Sharenkova, S. Hirai, Y. Kubota. Tech. Phys. Lett., 44 (12), 1087 (2018). DOI: 10.1134/S106378501812026X
- M.M. Kazanin, V.V. Kaminskii, S.M. Solov'ev. Tech. Phys., 45 (5), 659 (2000). DOI: 10.1134/1.1259698
- V.I. Strelov, E.B. Baskakov, U.N. Bendryshev, V.M. Kanevskii. Crystallography Reports, 64 (2), 311 (2019). DOI: 10.1134/S1063774519020299
- V.M. Egorov, V.V. Kaminskii, M.M. Kazanin, S.M. Solov'ev, A.V. Golubkov. Tech. Phys. Lett., 41 (4),381 (2015). DOI: 10.1134/S1063785015040227
- V.V. Kaminskii, A.O. Lebedev, S.M. Solov'ev, N.V. Sharenkova. Tech. Phys., 64 (2), 181 (2019). DOI: 10.1134/S1063784219020075
- M.A. Grevtsev, G.D. Havrov, S.A. Kazakov, V.V. Kaminskii. J. Phys.: Conf. Series, 1038, 012111 (2018). DOI: 10.1088/1742-6596/1038/1/012111
- V.V. Kaminskii, M.M. Kazanin. Tech. Phys. Lett., 34 (4), 361 (2008). DOI: 10.1134/S1063785008040263
- V.G. Bamburiv, O.V. Andreeve, V.V. Ivanov, A.N. Voropai, A.V. Gorshkov, A.A. Polovnokov, A.N. Bobylev. DAN 473 6 (676) (in Russian)
- V.V. Kaminskii, M.M. Kazanin, S.M. Solov'ev, N.V. Sharenkova, N.M. Volodin. Semiconductors, 40 (6), 651 (2006). DOI: 10.1134/S1063782606060078]
- Yu.E. Kalinin, V.A. Makagonov, S.Yu. Pankov, A.V. Sitnikov, M.V. khakhlenkov. Vestn. Vor.gos.tekh.un-ta, 10 (6), 135 (2014)
- P.E. Teterin, A.V. Zenkevich, Yu.Yu. Lebedinsky, O.E. Parfenov. Trudy nauchnoy sessii MIFI, 3, 172 (2010) (in Russian)
- E. Rogers, P.F. Smet, P. Dorenbos, D. Poelman, E. van der Kolk. J. Phys. Condens. Matter., 22, 015005 (2010). DOI: 10.1088/0953-8984/22/1/015005
- V.I. Strelov, E.B. Baskakov, V.V. Artemov. Tez. dokl. XXVIII Ross. konf. po elektronnoy microscopii (Tchernogolovka, Rossiya, 2020), t. 3. s. 97 (in Russian)
- E.B. Baskakov, V.I. Strelov. Crystallography Reports, 66 (6), 1078 (2021). DOI: 10.1134/S1063774521060055
- A.S. Vysokikh, P.V. Miodushevsky, P.O. Andreev. Vestn. TGU, 5, 179 (2011) (in Russian)
- N.N. Mikheev. J. Synch. Investig, 13 (4), 719 (2019). DOI: 10.1134/S1027451019040281
- V.P. Krivobokov, N.S. Sochugov, A.A. Soloviev. Plazmennye pokrytiya (metody i oborudovanie). (Izd-vo Tomskogo politekh. un-ta, Tomsk, 2007) (in Russian)
- B.A. Movchan, N.D. Tutov. Izvestiya Kurskogo gos. tekh. un-ta, 26 (1), 12 (2009) (in Russian)
- L.K. Markov, I.P. Smirnova, A.S. Pavlyuchenko, E.M. Arakcheeva, M.M. Kulagina. Semiconductors, 43 (11), 1521 (2009). DOI: 10.1134/S1063782609110219
- K.S.S. Harsha. Principles of Physical Vapor Deposition of Thin Films (Elsevier, Great Britain, 2006)
- A.S. Vysokikh, O.V. Andreev, L.A. Golovina. Vestnik tyumenskogo gos. un-ta, 3, 124 (2007) (in Russian)
- A.S. Vysokikh. Avtoreph.diss. (Tyumen, Tyumensky gos.un-t, 2011)
- I.S. Volchkov, E.B. Baskakov, V.I. Strelov, V.M. Kanevskii. Tech. Phys. Lett., 45 (11), 1127 (2019). DOI: 10.1134/S1063785019110294
- S.A. Shchukarev. Lektsii po obshchemu kursu khimii (Izd-vo LGU, L., 1962) (in Russian)
- A. Ivanov, B. Smirnov. Nanoindustriya, S (36), 28 (2012) (in Russian).
- V.V. Kaminskii, V.A. Didik, M.M. Kazanin, M.V. Romanova, S.M. Solov'ev. Tech. Phys. Lett., 35 (21), 981 (2009). DOI: 10.1134/S1063785009110030
- L.I. Mirkin. Spravochnik po rentgenostrukturnomu analizu polikristallov, pod red.prof. Ya.S. Umanskogo (Gos.izd. Fizmatlit, M., 1961) (in Russian), s. 12
- J. Goldstein, H. Yakowitz, D.E. Newbury, E. Lifshin, J.W. Colby, J.R. Coleman. Practical Scanning Electron Microscopy (Plenum Press, NY., 1975), p. 85.
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.