The effect of paired collisions of charge carriers on electrical conductivity thin conductive layer
Zavitaev E.V. 1, Rusakov O. V. 2, Chukhleb E.P.3
1 Mytischi Branch of Bauman Moscow State Technical University, Mytischi, Moscow oblast, Russia
2State University of Humanities and Technology, Orekhovo-Zuevo, Moscow oblast, Russia
3Municipal institution of additional education Center for additional education "Small Academy of Sciences Impulse", Moscow oblast, Russia
Email: eduardzavitaev@yandex.ru, olegrusmail@mail.ru, e.chuhleb@mail.ru

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For the first time, the problem of the effect of pair collisions of charge carriers on the electrical conductivity of a thin conducting layer was solved analytically. Permissible values of the layer thickness are limited by the dimensions at which quantum and skin effects do not appear. However, the ratio of the layer thickness to the free path of electrons can be arbitrary. The conditions of specular-diffuse reflection of charge carriers from the layer surfaces are taken as the boundary conditions of the problem. Limiting cases are considered and the results obtained are discussed. Keywords: thin layer, local conductivity, integral conductivity.
  1. E.H. Sondheimer. Phys. Rev., 80 (3), 401 (1950). DOI: 10.1103/PhysRev.80.401
  2. S. De Gennaro, A. Rettori. J. Phys. F: Met. Phys., 14 (12), 237 (1984). DOI: 10.1088/0305-4608/14/12/001
  3. L. Wang, M. Yin, A. Khan, S. Muhtadi, F. Asif, E.S. Choi, T. Datta. Phys. Rev. Appl., 9, 024006 (2018). DOI: 10.1103/PhysRevApplied.9.024006
  4. J. Zajman. Electrony i phonony (M., IL, 1962).
  5. A.I. Utkin, E.V. Zavitaev, A.A. Yushkanov. J. Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 10 (5), 962 (2016). DOI: 10.1134/S1027451016050153
  6. O.V. Savenko. Vestnik MGOU. Seriya: fizika-matematika (in Russian). 4, 43 (2016). DOI: 10.18384/2310-7251-2016-4-43-55
  7. I.A. Kuznetsova, D.N. Romanov, O.V. Savenko, A.A. Yushkanov. Russ. Microelectron., 46 (4), 252 (2017). DOI: 10.1134/S1063739717040059
  8. I.A. Kuznetsova, O.V. Savenko, A.A. Yushkanov. J. Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 11 (6), 1159 (2017). DOI: 10.1134/S1027451017060143
  9. E.V. Zavitaev, O.V. Rusakov, E.P. Chukhleb. Russ. Microelectron., 52 (1), 9 (2023). DOI: 10.1134/S1063739722700202
  10. E.V. Zavitaev, O.V. Rusakov, E.P. Chukhleb. J. Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 16 (4), 592 (2022). DOI: 10.1134/S1027451022040371
  11. A.I. Ansel'm. Vvedenie v teoriyu poluprovodnikov (Nauka, M., 1978) (in Russian)
  12. R.C. Munoz, J.P. Garcia, R. Henriquez, A.M. Moncada, A. Espinosa, M. Robles, G. Kremer, L. Moraga, S. Cancino, J.R. Morales, A. Ramirez, S. Oyarzun, M.A. Suarez, D. Chen, E. Zumelzu, C. Lizama. Phys. Rev. Lett., 96, 206803 (2006). DOI: 10.1103/PhysRevLett.96.206803
  13. R.C. Munoz, M.A. Su'arez, S. Oyarzun, R. Henri quez, A. Espinosa, G. Kremer, L. Moraga, S. Cancino, R. Morales. Phys. Rev. B, 81 (16), 165408 (2010). DOI: 10.1103/PhysRevB.81.165408
  14. J.S. Chawla, F. Gstrein, K.P. O'Brien, J.S. Clarke, D. Gall. Phys. Rev. B, 84 (23), 235423 (2011). DOI: 10.1103/PhysRevB.84.235423
  15. L. Moraga, R. Henriquez, B. Solis. Physica B: Condensed Matter., 470-471, 39 (2015). DOI: 10.1016/J.PHYSB.2015.04.034

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