Project of X-ray optical scheme of a lithograph with a transmissive dynamic mask and a synchrotron radiation source
Malyshev I.V. 1, Chkhalo N.I.1, Yakunin S.N.2,3
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Scientific Research Center Kurchatov Institute, Moscow, Russia
3NRC Kurchatov Institute and Institute of Crystallography RAS, Moscow, Russia
Email: ilya-malyshev@ipm.sci-nnov.ru

PDF
The paper proposes an X-ray optical scheme of a lithograph with a transmissive dynamic mask and a synchrotron radiation source. The image of a dynamic mask in the form of holes of small diameter is transferred with a decrease to a plate with a resist using a Schwarzschild projection lens. The formation of a topological pattern will occur due to the coordinated operation of the system for scanning a plate with a resist and a microelectromechanical system of a transmissive type. Objectives with a reduction of 10 and 20 times for obtaining 10-20 nm images of 200 nm holes of the dynamic mask are considered. The scheme of illumination of the mask is calculated, which provides uniform illumination on a field of 10x 10 mm2. For the synchrotron Siberia-2 of the KISI on a bending magnet, the expected productivity of the lithograph will be up to 1/14 of a plate with a diameter of 100 mm per hour. Keywords: X-ray lithography, X-ray optics, multilayer mirror, synchrotron radiation, aberrations. DOI: 10.61011/TP.2023.07.56638.111-23
  1. H. Kinoshita, K. Kurihara, Y. Ishii, Y. Torii. J. Vac. Sci. Technol. B: Microelectron. Processing and Phenomena, 7 (6), 1648 (1989). DOI: 10.1116/1.584507
  2. J.E. Bjorkholm, J. Bokor, L. Eichner, R.R. Freeman, J. Gregus, T.E. Jewell, W.M. Mansfield, A.A. Mac Dowell, E.L. Raab, W.T. Silfvast, L.H. Szeto, D.M. Tennant, W.K. Waskiewicz, D.L. White, D.L. Windt, O.R. Wood, J.H. Bruning. J. Vac. Sci. Technol. B: Microelectron. Processing and Phenomena, 8, 1509 (1990). DOI: 10.1116/1.585106
  3. G. Dattoli, A. Doria, G.P. Gallerano, L. Giannessi, K. Hesch, H.O. Moser, P.L. Ottaviani, E. Pellegrin, R. Rossmanith, R. Steininger, V. Saile, J. Wust. Nucl. Instr. Meth. Phys. Res. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 474 (3), 259 (2001)
  4. A.N. Genselev, B.G. Goldenberg, V.F. Pindyurin. Sposob provedeniya trafaretnoy skaniruyushchey sinkhrotronnoy rentgenovskoy litografii (Institute of Nuclear Physics, SB RAS, Patent RU 2344454 C1, 2009.01.20) (in Russian)
  5. K. Hesch, E. Pellegrin, R. Rossmanith, R. Steininger, V. Saile, J. Wust, G. Dattoli, A. Doria, G.P. Gallerano, L. Giannessi, P.L. Ottaviani, H.O. Moser. Conf.: Particle Accelerator Conference (Chicago, PAC, 1, 654,2001), DOI: 10.1109/PAC.2001.987596
  6. B. Jiang, Ch. Feng, Ch. Li, Z. Bai, W. Wan, D. Xiang, Q. Gu, K. Wang, Q. Zhang, D. Huang, S. Chen. Scientific Reports, 12, 3325 (2022)
  7. N. Choksi, D.S. Pickard, M. McCord, R.F.W. Pease, Y. Shroff, Y. Chen, W. Oldham, D. Markle. J. Vac. Sci. Technol., 17, 3047 (1999). DOI: 10.1116/1.590952
  8. N.I. Chkhalo, V.N. Polkovnikov, N.N. Salashchenko, M.N. Toropov. Proc. SPIE, 10224, 102241O-1-O8 (2016)
  9. G.D. Demin, P.P. Kim, N.A. Dyuzhev. Mater. XXVI Mezhdunarodnogo simpoziuma "Nanofizika i nanoelektronika", 1, 544 (2022) (in Russian)
  10. Electronic source. Available at: http://kcsni.nrcki.ru/pages/main/sync/source/index.shtml
  11. A.D. Nikolenko, A.V. Bukhtiyarov, O.E. Tereshchenko, K.V. Zolotarev. Mater. XXVI Mezhdunarodnogo simpoziuma "Nanofizika i nanoelektronika", 1, 572 (2022) (in Russian)
  12. I.V. Malyshev, A.E. Pestov, V.N. Polkovnikov, D.G. Reunov, M.N. Toropov, N.I. Chkhalo, Ya.V. Rakshun, Yu.V. Khomyakov, V.A. Chernov, I.A. Shchelokov. Poverkhnost' Rentgenovskie, sinkhrotronnye i neytronnye issledovaniya 5, 3 (2023) (in Russian)
  13. Electronic source. Available at: http://kcsni.nrcki.ru/files/pdf/otchet_2020.pdf
  14. N.I. Chkhalo, I.A. Kaskov, I.V. Malyshev, M.S. Mikhaylenko, A.E. Pestov, V.N. Polkovnikov, N.N. Salashchenko, M.N. Toropov, I.G. Zabrodin. Precision Engineer., 48, 338 (2017). DOI: 10.1016/j.precisioneng.2017.01.004
  15. M.V. Svechnikov, N.I. Chkhalo, S.A. Gusev, A.N. Nechay, D.E. Pariev, A.E. Pestov, V.N. Polkovnikov, D.A. Tatarskiy, N.N. Salashchenko, F. Schafers, M.G. Sertsu, A. Sokolov, Y.A. Vainer, M.V. Zorina. Opt. Expr., 26 (26), 33718 (2018). DOI: 10.1364/OE.26.033718
  16. R.M. Smertin, N.I. Chkhalo, M.N. Drozdov, S.A. Garakhin, S.Yu. Zuev, V.N. Polkovnikov, N.N. Salashchenko, P.A. Yunin. Opt. Expr., 30 (26), 46749 (2022)
  17. N. Chkhalo, A. Lopatin, A. Nechay, D. Pariev, A. Pestov, V. Polkovnikov, N. Salashchenko, F. Schafers, M. Sertsu, A. Sokolov, M. Svechnikov, N. Tsybin, S. Zuev. J. Nanosci. Nanotechnol, 19, 546 (2019). DOI: 10.1166/jnn.2019.16474
  18. Electronic source. Available at: https://www.aps.anl.gov/Science/Scientific-Software/OASYS
  19. P.Yu. Glagolev, N.A. Dyuzhev, V.I. Korneev, G.D. Demin. Mater. XXVI Mezhdunarodnogo simpoziuma "Nanofizika i nanoelektronika", 2, 843 (2023) (in Russian)

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru