Short-period multilayer mirrors for high-resolution multilayer mirror/crystal monochromator
Polkovnikov V. N. 1, Chkhalo N. I. 1, Shaposhnikov R. A.1, Nikolenko A. D. 2
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
Email: shaposhnikov-roma@mail.ru

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The paper presents the results of studies of W/B4C multilayer structures with small periods for their use as the first mirror in a two-mirror soft X-ray monochromator at the "KOSMOS" station of the VEPP-4M synchrotron. It is shown that even if the periods of the mirror and the RbAP crystal coincide, when operating in a wide wavelength range, the Bragg angle must be adjusted due to the stronger refraction in the W/B4C multilayer mirror. Keywords: multilayer X-ray mirrors, synchrotron applications, X-ray monochromators. DOI: 10.61011/TP.2023.07.56631.102-23
  1. P.S. Zavertkin, D.V. Ivlyushkin, M.R. Mashkovtsev, A.D. Nikolenko, S.A. Sutormina, N.I. Chkhalo. Optoelectronics, Instrumentation and Data Processing, 55 (2), 107 (2019). DOI: 10.3103/S8756699019020018
  2. K. Yamashita, M. Watanabe, O. Matsudo, J. Yamazaki, I. Hatsukade, T. Ishigami, S. Takahama, K. Tamura, M. Ohtani. Rev. Scientific Instruments, 63, 1217 (1992). DOI: 10.1063/1.1143087
  3. G. Laan, J. Goedkoop, J. Fuggle, M. Bruijn, J. Verhoeven, M.J.V. Wiel, A. MacDowell, J. West, I. Munro. Nucl. Instrum. Methods Phys. Res. Section A-accelerators Spectrometers Detectors and Associated Equipment, 255 (3), 592 (1987). DOI: 10.1016/0168-9002(87)91229-0
  4. S. Bajt, D. G. Stearns. Appl. Opt., 44 (36), 7735 (2005). DOI: 10.1364/AO.44.007735
  5. P.C. Pradhan, A. Majhi, M. Nayak. J. Appl. Phys., 123, 095302 (2018). DOI: 10.1063/1.5018266
  6. S.S. Andreev, M.S. Bibishkin, N.I. Chkhalo, E.B. Kluenkov, K.A. Prokhorov, N.N. Salashchenko, M.V. Zorina, F. Schafers, L.A. Shmaenok. J. Synchrotron Radiation, 10 (5), 358 (2003). DOI: 10.1107/S0909049503015255
  7. M.S. Bibishkin, N.I. Chkhalo, A.A. Fraerman, A.E. Pestov, K.A. Prokhorov, N.N. Salashchenko, Yu.A. Vainer. Nucl. Instrum. Methods in Phys. Res. A, 543, 333 (2005). DOI: 10.1016/j.nima.2005.01.251
  8. Ch. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J.-Y. Massonnat, J.-Ch. Peffen, E. Debourg. Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II, 5918, 591801 (2005). DOI: 10.1117/12.613873
  9. P.N. Rao, S.K. Rai, M. Nayak, G.S. Lodha. Appl. Opt., 52 (25), 6126 (2013). DOI: 10.1364/AO.52.006126
  10. P.S. Singam, M. Nayak, R. Gupta, P.C. Pradhan, A. Majhi, Sh. Narendranath, P. Sreekumar. J. Astron. Telesc. Instrum. Syst., 4 (4), 044003 (2018). DOI: 10.1117/1.JATIS.4.4.044003
  11. A.D. Akhsakhalyan, E.B. Kluenkov, A.Ya. Lopatin, V.I. Luchin, A.N. Nechay, A.E. Pestov, V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, M.N. Toropov, N.N. Tsybin, N.I. Chkhalo, A.V. Shcherbakov. J. Surf. Investigation: X-ray, Synchrotron and Neutron Techniques, 11, 1 (2017). DOI: 10.1134/S1027451017010049
  12. M. Svechnikov. J. Appl. Crystallogr., 53 (1), 244 (2020). DOI: 10.1107/S160057671901584X

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