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Magnetic Properties of magnetron sputtered La_0.7Sr_0.3MnO₃ thin films

DOI: 10.61011/TPL.2023.06.56381.19545

Shaikhulov T. A.¹, Stankevich K. L.², Luzanov V. A.¹, Zhivulin V. E. ³, Vinnik D. A. ³, Safin A. R.^1,4, Kalyabin D. V. ^1,5, Kozlova E. E.^1,5, Nikitov S. A. ^1,5,6

¹Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia
²Lomonosov Moscow State University, Moscow, Russia
³South Ural State University (National Research University), Chelyabinsk, Russia
⁴National Research University «Moscow Power Engineering Institute», Moscow, Russia
⁵Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
⁶Saratov State University, Saratov, Russia

Email: shcaihulov@hitech.cplire.ru

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Abstract
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The results of studying the influence of the thickness of La_0.7Sr_0.3MnO₃ films obtained by magnetron sputtering on (110) NdGaO₃ substrates on the magnetic and crystallographic properties using ferromagnetic resonance and X-ray spectroscopy are presented. The dependences of the uniaxial and cubic anisotropy fields on the sample thickness are established. Furthermore, it is shown that the magnetic and crystallographic properties of a film obtained by magnetron sputtering strongly depend on the target region from which it is made. The results obtained will be useful for interpreting the experimental data and creating a series of samples. Keywords: ferromagnet, magnetic anisotropy, ferromagnetic resonance. DOI: 10.61011/TPL.2023.06.56381.19545

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