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Home » Technical Physics » Year 2022, issue 8 » Article p. 956
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Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO_4)2 and NaNd(MoO_4)2 Ceramics Irradiated with High-Energy Ions
Russian version
DOI: 10.21883/TP.2022.08.54556.69-22
Yunin P. A.1, Nazarov A. A.1,2, Potanina E. A.2
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Lobachevsky State University, Nizhny Novgorod, Russia
Email: yunin@ipmras.ru
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The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO_4)2 and NaNd(MoO_4)2 ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO_4)2 ceramics to external radiation exposure as compared to NaNd(WO_4)2 has been demonstrated. Keywords: X-ray diffraction, Parallel beam method, Grazing incidence geometry, Ion irradiation, Ceramics, Radiation resistance, Amorphization, Damaged layer.
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