Physics of the Solid State
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Structure, microstructure and optical properties of SrFe2/3W1/3O3 multiferroics thin films grown on MgO(001) substrate
Pavlenko A.V.
1, Nazarenko A.V.
1, Zhidel' K.M.
1, Stryukov D.V.
1
1Federal Research Center Southern Scientific Center of the Russian Academy of Sciences, Rostov-on-Don, Russia
Email: AntVPR@mail.ru
The SrFe2/3W1/3O3 multiferroic thin films were grown on a MgO(001) substrate using RF-cathode sputtering method in an oxygen atmosphere. It was found that the obtained SrFe2/3W1/3O3 films are single-phase and single-crystal. According to the X-ray diffraction analysis they have a tetragonal unit cell with a=b=3.930 Angstrem and c=3.964 Angstrem parameters. It was shown that the SrFe2/3W1/3O3 films exhibit transparency (T=62-75 %) in the visible and near-IR wavelength ranges. The dispersion dependences of the refractive index n(λ) and absorption coefficient k(λ) of strontium ferrotungstate films were firstly determined in the wavelength range λ=350-1100 nm using the spectral ellipsometry method. Keywords: heterostructures, SWFO, ellipsometry, refraction index.
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