Exithon reflection spectra in thin layers WS2
Kotova L.V.
1, Zedomi T.E.1, Kochereshko V.P.1
1Ioffe Institute, St. Petersburg, Russia
Email: kotova@mail.ioffe.ru
The spectra of polarised light reflection from WS2 multilayers deposited on a Si/SiO2 substrate were investigated. It was shown that the features of the photoluminescence and reflection spectra at energies in the range of 1.9-2.1 eV are related to the dimensional quantisation of polaritons in a WS2 layer with a thickness of 0.32 mkm. The parameters of exciton polaritons, such as resonance frequency, oscillator strength, and damping, were determined. When studying the spectral dependence of the circular polarisation of light reflected from the sample, optical anisotropy was observed. Keywords: spectroscopy, transition metal dichalcogenides, polarisation, excitons.
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