Optical properties of non-stoichiometric titanium oxides
Gerasimova A.K. 1, Voronkovskii V.A. 1, Kalmykov D.A.1, Aliev V.Sh. 1,2, Volodin V.A.1,3, Demyanenko M.A.1
1Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk State Technical University, Novosibirsk, Russia
3Novosibirsk State University, Novosibirsk, Russia
Email: gerasimova@isp.nsc.ru, voronkovskii@isp.nsc.ru, kalmykov@isp.nsc.ru, aliev@isp.nsc.ru, volodin@isp.nsc.ru, demyanenko@isp.nsc.ru

PDF
Optical properties of non-stoichiometric titanium oxides TiO2-δ with different magnitude of deviation from stoichiometry δ have been investigated. The films were synthesized by ion-beam sputtering deposition method. The composition of the films was determined by X-ray photoelectron spectroscopy. The relationship between the optical parameters (n,k) of the films and their composition δ has been established. It was found that annealing of the films of the composition δ~0.58±0.02 at temperatures 350-600oC leads to a significant increase in absorption in the THz regions of the spectrum due to the growth of micron-sized plate-shaped crystals in the films, according to the data of scanning electron microscopy. Keywords: thin films, non-stoichiometric titanium oxides, X-ray photoelectron spectroscopy, spectral ellipsometry, optical losses.
  1. V.N. Kruchinin, V.Sh. Aliev, A.K. Gerasimova, V.A. Gritsenko. Opt. i spektr., 121 (2), 260--265 (2016) (in Russian). DOI: 10.7868/S0030403416080092
  2. V.N. Kruchinin, V.A. Volodin, T.V. Perevalov, A.K. Gerasimova, V.Sh. Aliev, V.A. Gritsenko. Opt. i spektr., 124 (6), 777--782 (2018) (in Russian). DOI: 10.21883/OS.2018.06.46080.39-18
  3. V.N. Kruchinin, T.V. Perevalov, V.Sh. Aliev, R.M.Kh. Iskhakzai, E.V. Spesivtsev, V.A. Gritsenko, V.A. Pustovarov . Opt. and spektr., 128 (10), 1467--1472 (2020). DOI: 10.21883/OS.2020.10.50016.12-20
  4. Y. Ashok Kumar Reddy, Y.B. Shin, I.K. Kang, H.C. Lee, P. Sreedhara Reddy. Appl. Phys. Lett., 107 (2), 023503 (2015). DOI: 10.1063/1.4926604
  5. S.A. Gavrilov, A.A. Dronov, V.I. Shevyakov, A.N. Belov, E.A. Poltoratskiy. Rossiyskiye nanotekhnologii, 4 (3-4), 123--129 (2009) (in Russian)
  6. Y. Ju, Z. Wu, S. Li, X. Dong, Y. Jiang, J. Nanoelectron. Optoelectron., 7 (3), 317--321 (2012). DOI: 10.1166/jno.2012.1308
  7. A.A. Goncharov, A.N. Dobrovolsky, E.G. Kostin, I.S. Petrik, E.K. Frolova. ZhTF, 84 (6), 98--106 (2014) (in Russian). URL: https://journals.ioffe.ru/articles/viewPDF/ 27261
  8. H. Malik, S. Sarkar, S. Mohanty, K. Carlson. Sci. Rep., 10 (1), 8050 (2020). DOI: 10.1038/s41598-020-64918-0
  9. Y. Reddy, Y.B. Shin, I.K. Kang, H.C. Lee. J. Appl. Phys., 119 (4), 044504 (2016). DOI: 10.1063/1.4940957
  10. L. Li, Z. Wu, Y. Ju, C. Chen. Energy Procedia, 12, 456--461 (2011). DOI: 10.1016/j.egypro.2011.10.061
  11. V.A. Shvets, V.Sh. Aliev, D.V. Gritsenko, S.S. Shaimeev, E.V. Fedosenko, S.V. Rykhlitski, V.V. Atuchin, V.A. Gritsenko, V.M. Tapilin, H. Wong. J. Non-Crystall. Sol., 354, 3025--3033 (2008). DOI: 10.1016/j.jnoncrysol.2007.12.013
  12. J.H. Scofield. J. Electron Spectrosc. Rel. Phenomena, 8 (2), 129--137 (1976). DOI: 10.1016/0368-2048(76)80015-1
  13. S.V. Rykhlitsky, E.V. Spesivtsev, V.A. Shvets, V.Yu. Prokopiev. PTE 2, 161 (2012) (in Russian). DOI: 10.21883/OS.2019.11.48513.136-19
  14. J.F. Moudler, W.F. Stickle, P.E. Sobol, K.D. Bomben. Handbook of X-ray photoelectron spectroscopy (Perkin-Elmer, Eden Prairie, 1992)
  15. V.S. Aliev, A.K. Gerasimova, V.N. Kruchinin, V.A. Gritsenko, I.P. Prosvirin, I.A. Badmaeva. Mater. Res. Expr., 3 (8), 085008 (2016). DOI: 10.1088/2053-1591/3/8/085008
  16. Fundamental XPS Data from Pure Elements, Pure Oxides, and Chemical Compounds. URL: http://www.xpsdata.com/fundxps.pdf
  17. S. Adachi. Optical Constants of Crystalline and Amorphous Semiconductors: Numerical Data and Graphical Information (Springer Science + Business Media, 2013)
  18. W.S. Werner, K. Glantschnig, C. Ambrosch-Draxl. J. Phys. Chem. Ref. Data, 38 (4), 1013--1092 (2009). DOI: 10.1063/1.3243762

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru