Bodnarchuk Ya.V.1, Gainutdinov R.V.1, Volk T.R.1
1Shubnikov Institute of Crystallography of Kurchatov complex “Crystallography and photonics” of NRC “Kurchatov institute”, Moscow, Russia
Email: deuten@mail.ru, rgaynutdinov@gmail.com, volk-1234@yandex.ru
Micro- and nanodomain structures were written by AFM-tip voltages on the nonpolar (X) surface using special in LNOI thin film (LiNbO3-on-insulator). Properties of structures recording have been investigated and discussed. The domain structures investigation was carried out by the PFM method. The dependences of the domain length on the pulse duration and voltage are obtained, them well approximated by exponential and linear functions, respectively. Piezoelectric hysteresis loops were measured and coercive and bias voltages were estimated. Analysis of hysteresis loops showed that the values of coercive and bias voltages are practically independent on the time of the voltage pulse applied to the AFM tip Keywords: domain structures, thin film, atomic force microscopy, lithium niobate.
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