Capsule gas-filled target for a laser-plasma EUV source
Lopatin A.Ya.1, Nachay A.N.1, Perekalov A.A.1, Pestov A.E.1, Soloviev A.A.2, Tsybin N.N.1, Chkhalo N.I.1, Dmitriev D.S.1
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod, Russia

PDF
A new design of a laser target - a container with a thin-film wall containing a gas under significant pressure is proposed. It is assumed (and this assumption will be tested experimentally), that, with a certain combination of design parameters, lines belonging to the gas enclosed in the target volume will prevail in the spectrum of extreme ultraviolet radiation of a laser-plasma source with such a target. The necessary experimental equipment has been developed and manufactured, including a set of identical targets with a Mo/ZrSi2 membrane with a thickness of 0.19 μm. It has been experimentally demonstrated that the samples from the manufactured kit withstand a pressure of at least 1.5 atm. Keywords: SXR and EUV radiation, thin films, laser plasma, gas target.
  1. M.D. Rosen, P.L. Hagelstein, D.L. Matthews, E.M. Campbell, A.U. Hazi, B.L. Whitten, B. MacGowan, R.E. Turner, R.W. Lee, G. Charatis, G.E. Busch, C.L. Shepard, P.D. Rockett. Phys. Rev. Lett., 54 (2), 106 (1985). DOI: 10.1103/PhysRevLett.54.106
  2. S. Maxon, P. Hagelstein, J. Scofield, Y. Lee. J. Appl. Phys., 59 (1), 293 (1986). DOI: 10.1063/1.336834
  3. T.N. Lee, E.A. McLean, R.C. Elton. Phys. Rev. Lett., 59 (11), 1185 (1987). DOI: 10.1103/PhysRevLett.59.1185
  4. M. Nishikino, Yo. Ochi, N. Hasegawa, T. Kawachi, H. Yamatani, T. Ohba, T. Kaihori, K. Nagashima. Rev. Sci. Instrum., 80 (11), 116102 (2009). DOI: 10.1063/1.3262634
  5. D. Babonneau, M. Primout, F. Girard, J.-P. Jadaud, M. Naudy, B. Villette, S. Depierreux, C. Blancard, G. Faussurier, K.B. Fournier, L. Suter, R. Kauffman, S. Glenzer, M.C. Miller, J. Grun, J. Davis. Phys. Plasmas, 15 (9), 092702 (2008). DOI: 10.1063/1.2973480
  6. Sh.-Yo. Tu, G.-Yu. Hu, W.-Yo. Miao, B. Zhao, J. Zheng, Yo.-T. Yuan, X.-Yu Zhan, L.-F. Hou, Sh.-E. Jiang, Yo.-K. Ding. Phys. Plasmas, 21 (4), 043107 (2014). DOI: 10.1063/1.4871730
  7. S.A. Garakhin, A.Ya. Lopatin, A.N. Nechay, A.A. Perekalov, A.E. Pestov, N.N. Salashchenko, N.N. Tsybin, N.I. Chkhalo. Tech. Phys., 67 (8), 1015 (2022) DOI: 10.21883/TP.2022.08.54565.75-22
  8. A.Ya. Lopatin, V.I. Luchin, A.N. Nachay, A.A. Perekalov, A.E. Pestov, N.N. Salashchenko, A.A. Soloviev, N.N. Tsybin, N.I. Chkhalo. Tech. Phys., 68 (7), 829 (2023). DOI: 10.61011/TP.2023.07.56623.97-23
  9. A. L'Huillier, P. Balcou. Phys. Rev. Lett., 70 (6), 774 (1993). DOI: 10.1103/PhysRevLett.70.774
  10. C.-G. Wahlstrom, J. Larsson, A. Persson, T. Starczewski, S. Svanberg, P. Salieres, Ph. Balcou, A. L'Huillier. Phys. Rev. A, 48 (6), 4709 (1993). DOI: 10.1103/PhysRevA.48.4709
  11. J. Zhou, J. Peatross, M.M. Murnane, H.C. Kapteyn, I.P. Christov. Phys. Rev. Lett., 76 (5), 752 (1996). DOI: 10.1103/PhysRevLett.76.752
  12. J.-P. Brichta, M.C.H. Wong, J.B. Bertrand, H.-C. Bandulet, D.M. Rayner, V.R. Bhardwaj. Phys. Rev. A, 79 (3), 033404 (1993). DOI: 10.1103/PhysRevA.79.033404
  13. D. Guenot, D. Gustas, A. Vernier, B. Beaurepaire, F. Bohle, M. Bocoum, M. Lozano, A. Jullien, R. Lopez-Martens, A. Lifschitz, J. Faure. Nature Photon., 11 (5), 293 (2017). DOI: 10.1038/nphoton.2017.46
  14. A. Pak, K.A. Marsh, S.F. Martins, W. Lu, W.B. Mori, C. Joshi. Phys. Rev. Lett., 104 (2), 025003 (2010). DOI: 10.1103/PhysRevLett.104.025003
  15. N. Delbos, C. Werle, I. Dornmair, T. Eichner, L. Hubner, S. Jalas, S.W. Jolly, M. Kirchen, V. Leroux, P. Messner, M. Schnepp, M. Trunk, P.A. Walker, P. Winkler, A.R. Maier. Nucl. Instrum. Methods Phys. Res. A, 909, 318 (2018). DOI: 10.1016/j.nima.2018.01.082
  16. H.-E. Tsai, K.K. Swanson, S.K. Barber, R. Lehe, H.-Sh. Mao, D.E. Mittelberger, S. Steinke, K. Nakamura, J. van Tilborg, C. Schroeder, E. Esarey, C.G.R. Geddes, W. Leemans. Phys. Plasmas, 25 (4), 043107 (2018). DOI: 10.1063/1.5023694
  17. H. Komori, Y. Ueno, H. Hoshino, T. Ariga, G. Soumagne, A. Endo, H. Mizoguchi. Appl. Phys. B., 83 (2), 213 (2006). DOI: 10.1007/s00340-006-2172-7
  18. V.P. Belik, S.G. Kalmykov, A.M. Mozharov, M.V. Petrenko, M.E. Sasin. Tech. Phys. Lett., 43 (12), 1001 (2017). DOI: 10.1134/S1063785017110177
  19. A.N. Nechay, A.A. Perekalov, N.N. Salashchenko, N.I. Chkhalo. Opt. i spektr., 129 (3), 266 (2021). (in Russian) DOI: 10.21883/OS.2021.03.50652.282-20
  20. I.L. Beigman, E.A. Vishnyakov, M.S. Luginin, E.N. Ragozin, I.Yu. Tolstikhina. Quantum Electron., 40 (6), 545 (2010). DOI: 10.1070/QE2010v040n06ABEH014313
  21. B.A. Volodin, S.A. Gusev, M.N. Drozdov, S.Yu. Zuev, E.B. Klyuenkov, A.Ya. Lopatin, V.I. Luchin, A.E. Pestov, N.N. Salashchenko, N.N. Tsybin, N.I. Chkhalo. Bull. Russ. Acad. Sci. Phys., 74 (3), 46 (2010). DOI: 10.3103/S1062873810010120
  22. J.D. Baek, Y.J. Yoon, W. Lee, P.-Ch. Su. Energy Environ. Sci., 8 (11), 3374 (2015). DOI: 10.1039/C5EE02328A
  23. N.I. Chkhalo, E.B. Kluenkov, A.Ya. Lopatin, V.I. Luchin, N.N. Salashchenko, L.A. Sjmaenok, N.N. Tsybin. Thin Solid Films, 631, 93 (2017). DOI: 10.1016/j.tsf.2017.04.015
  24. N.I. Chkhalo, S.V. Kuzin, A.Ya. Lopatin, V.I. Luchin, N.N. Salashchenko, S.Yu. Zuev, N.N. Tsybin. Thin Solid Films, 653, 359 (2018). DOI: 10.1016/j.tsf.2018.03.051
  25. S.Yu Zuev, E.B> Klyuenkov, A.Ya. Lopatin, V.I. Luchin, D.G. Pariev, R.S. Pleshkov, V.N. Polkovnikov, N.N. Salashchenko, M.V. Svechnikov, N.N. Tsybin, N.I. Chkhalo. Kharakterizatsiya absorbtsionnykh filtrov EUF izlucheniaya na osnove plenok berilliya submikronnoy tolshchiny. (Tr. XXII simp. "Nanofizika i nanoelektronika" t. 1, s. 438 (2018) (in Russian)
  26. A.V. Vodop'yanov, S.A. Garakhin, I.G. Zabrodin, S.Yu. Zuev, A.Ya. Lopatin, A.N. Nechay, A.E. Pestov, A.A. Perekalov, R.S. Pleshkov, V.N. Polkovnikov, N.N. Salashchenko, R.M. Smertin, B.A. Ulasevich, N.I. Chkhalo. Quantum Electron., 51 (8), 700 (2021). DOI: 10.1070/QEL17598
  27. P.N. Aruev, M.M. Barysheva, B.Ya. Ber, N.V. Zabrodskaya, V.V. Zabrodskii, A.Ya. Lopatin, A.E. Pestov, M.V. Petrenko, V.N. Polkovnikov, N.N. Salashchenko, V.L. Sukhanov, N.I. Chkhalo. Quantum Electron., 42 (10), 943 (2012). DOI: 10.1070/QE2012v042n10ABEH014901
  28. L.L. Coatsworth, G.M. Bancroft, D.K. Creber, R.J.D. Lazier, P.W.M. Jacobs. J. Electron Spectros. Relat. Phenomena, 13 (3), 395 (1978). DOI: 10.1016/0368-2048(78)85043-9

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru