Phenomenological model of a broadband optical absorber
Lerer A. M. 1, Timoshenko P. E. 1
1Southern Federal University, Rostov-on-Don, Russia
Email: Lerer@SFedU.ru, PETimoshenko@SFedU.ru

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Modelling of the process of electromagnetic wave absorption in a composite layer of nanotubes is carried out on the basis of the phenomenological model of the composite layer of an anisotropic black body. The anisotropic black body model allowed to achieve a small reflection and absorption coefficient of more than 95% in a wide wavelength range, which agrees well with the experimental data. Keywords: broadband absorbers, carbon nanotubes, black body model.
  1. N.I. Landy, S. Sajuyigbe, J.J. Mock, D.R. Smith, W.J. Padilla. Phys. Rev. Lett., 100, 207402 (2008). DOI: 10.1103/PhysRevLett.100.207402
  2. Z. Li, S. Butun, K. Aydin. ACS Photonics, 2, 183 (2015). DOI: 10.1021/ph500410u
  3. D. Zhao, L. Meng, H. Gong, X. Chen, Y. Chen, M. Yan, Q. Li, M. Qiu. Appl. Phys. Lett., 104, 221107 (2014). DOI: 10.1063/1.4881267
  4. P. Yu, L.V. Besteiro, Y. Huang, J. Wu, L. Fu, H.H. Tan, C. Jagadish, G.P. Wiederrecht, A.O. Govorov, Z. Wang. Adv. Opt. Mater., 7 (3), 1800995 (2019). DOI: 10.1002/adom.201800995
  5. A. Shevlyagin, V. Il'yaschenko, A. Kuchmizhak, E. Mitsai, A. Sergeev, A. Amosov, A. Gerasimenko, A. Gutakovskii. Appl. Surf. Sci., 602 154321 (2022). DOI: 10.1016/j.apsusc.2022.154321
  6. T.V. Borbotko, H.N. Wang. BGUIR Reports, 5, 23 (2005) (in Russian)
  7. A.F. Brooks, G. Vajente, H. Yamamoto, R. Abbott, C. Adams, R.X. Adhikari, A. Ananyeva, S. Appert, K. Arai, J.S. Areeda, Y. Asali, S.M. Aston, C. Austin, A.M. Baer, M. Ball, S.W. Ballmer, Sh. Banagiri, D. Barker, L. Barsotti, J. Bartlett, B.K. Berger, J. Betzwieser, D. Bhattacharjee, G. Billingsley, S. Biscans, C.D. Blair, R.M. Blair, N. Bode, Ph. Booker, R. Bork, A. Bramley, D.D. Brown, A. Buikema, C. Cahillane, K.C. Cannon, H.T. Cao, X. Chen, A.A. Ciobanu, F. Clara, C. Compton, S.J. Cooper, K.R. Corley, S.T. Countryman, P.B. Covas, D.C. Coyne, L.E. Datrier, D. Davis, Ch.D. Difronzo, K.L. Dooley, J.C. Driggers, P. Dupej, Sh.E. Dwyer, A. Effler, T. Etzel, M. Evans, T.M. Evans, J. Feicht, A. Fernandez-Galiana, P. Fritschel, V.V. Frolov, P. Fulda, M. Fyffe, J.A. Giaime, D.D. Giardina, P. Godwin, E. Goetz, S. Gras, C. Gray, R. Gray, A.C. Green, A. Gupta, E.K. Gustafson, D. Gustafson, E. Hall, J. Hanks, J. Hanson, T. Hardwick, R.K. Hasskew, M.C. Heintze, A.F. Helmling-Cornell, N.A. Holland, J.D. Jones, Sh. Kandhasamy, S. Karki, M. Kasprzack, K. Kawabe, N. Kijbunchoo, P.J. King, J.S. Kissel, R. Kumar, M. Landry, B.B. Lane, B. Lantz, M. Laxen, Ya.K. Lecoeuche, J. Leviton, L. Jian, M. Lormand, A.P. Lundgren, R. Macas, M. Macinnis, D.M. Macleod, G.L. Mansell, S. Marka, Z. Marka, D.V. Martynov, K. Mason, T.J. Massinger, F. Matichard, N. Mavalvala, R. McCarthy, D.E. McClelland, S. McCormick, L. McCuller, J. McIver, T. McRae, G. Mendell, K. Merfeld, E.L. Merilh, F. Meylahn, T. Mistry, R. Mittleman, G. Moreno, C.M. Mow-Lowry, S. Mozzon, A. Mullavey, T.J. Nelson, P. Nguyen, L.K. Nuttall, J. Oberling, R.J. Oram, C. Osthelder, D.J. Ottaway, H. Overmier, J.R. Palamos, W. Parker, E. Payne, A. Pele, R. Penhorwood, C.J. Perez, M. Pirello, H. Radkins, K.E. Ramirez, J.W. Richardson, K. Riles, N.A. Robertson, J.G. Rollins, Ch.L. Romel, J.H. Romie, M.P. Ross, K. Ryan, T. Sadecki, E.J. Sanchez, L.E. Sanchez, S.R. Tiruppatturrajamanikkam, R.L. Savage, D. Schaetzl, R. Schnabel, R.M. Schofield, E. Schwartz, D. Sellers, Th. Shaffer, D. Sigg, B.J. Slagmolen, J.R. Smith, S. Soni, B. Sorazu, A.P. Spencer, K.A. Strain, L. Sun, M.J. Szczepanczyk, M. Thomas, P. Thomas, K.A. Thorne, K. Toland, C.I. Torrie, G. Traylor, M. Tse, A.L. Urban, G. Valdes, D.C. Vander-Hyde, P.J. Veitch, K. Venkateswara, G. Venugopalan, A.D. Viets, Th. Vo, Ch. Vorvick, M. Wade, R.L. Ward, J. Warner, B. Weaver, R. Weiss, Ch. Whittle, B. Willke, Ch.C. Wipf, L. Xiao, H. Yu, H. Yu, L. Zhang, M.E. Zucker, J. Zweizig. Appl. Opt., 60, 4047 (2021). DOI: 10.1364/AO.419689
  8. Y. Fan, F. Zhang, Q. Zhao, Z. Wei, H. Li. Opt. Lett., 39, 6269 (2014). DOI: 10.1364/OL.39.006269
  9. Y. Fan, N. Shen, F. Zhang, Q. Zhao, H. Wu, Q. Fu, Z. Wei, H. Li, C.M. Soukoulis. Adv. Opt. Mater., 7, 1800537 (2019). DOI: 10.1002/adom.201800537
  10. H. Li, M. Qin, L. Wang, X. Zhai, R. Ren, J. Hu. Opt. Express, 25, 31612 (2017). DOI: 10.1364/OE.25.031612
  11. G. Lu, F. Wu, M. Zheng, C. Chen, X. Zhou, C. Diao, F. Liu, G. Du, C. Xue, H. Jiang, H. Chen. Opt. Express, 27, 5326 (2019). DOI: 10.1364/OE.27.005326
  12. F. Ding, J. Yi, B. Li, H. Cheng, L. Mo, S. He. Laser Photonics Rev., 8, 946 (2014). DOI: 10.1002/lpor.201400157
  13. A.S. Hall, M. Faryad, G.D. Barber, L. Liu, S. Erten, T.S. Mayer, A. Lakhtakia, T.E. Mallouk. ACS Nano, 7 (6), 4995 (2013). DOI: 10.1021/nn4003488
  14. P. Yu, L.V. Besteiro, J. Wu, Y. Huang, Y. Wang, A.O. Govorov, Z. Wang. Opt. Express, 26 (16), 20471 (2018). DOI: 10.1364/OE.26.020471
  15. V. Ghai, H. Singh, P.K. Agnihotri. ACS Appl. Nano Mater., 2, 7951 (2019). DOI: 10.1021/acsanm.9b01950
  16. J. Lehman, C. Yung, N. Tomlin, D. Conklin, M. Stephens. Appl. Phys. Rev., 5, 011103 (2018). DOI: 10.1063/1.5009190
  17. A.M. Lehrer, V.V. Makhno, V.I. Kravchenko. ZhTF, 93 (4), 438 (2023) (in Russian). DOI: 10.21883/0000000000
  18. A.M. Lerer. J. Commun. Technol. Electron., 57 (11), 1151 (2012). DOI: 10.1134/S106422691210004X
  19. L.N. Zakhar'yev, A.A. Limanskiy Rasseyaniye voln chernymi telami (M.: Sov. radio, 1972) (in Russian)
  20. B.D. Wood. J. Appl. Phys., 118, 013106 (2015). DOI: 10.1063/1.4923390
  21. Vantablack S-VIS/S-IR. Opticheskie svojstva i dannye kosmicheskilkh kvalifikacionnykh ispytanij (Surrey NanoSystems 2023)
  22. F.I. Fedorov. Optika anizotropnykh sred (Editorial URSS, M., 2004), p. 379 (in Russian).

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