Determination of moisture content in vegetative cultivated plants by the method of millimeter wave spectroscopy for the tasks of increasing plant productivity
von Gratovski S. V.1, Kocherina N. V.2, Parkhomenko M. P.1, Kalenov D. S.1, Fedoseev N. A.1, Eremin I. S.1
1Kotelnikov Institute of Radioengineering and Electronics, Fryazino Branch, Russian Academy of Sciences
2Agrophysical Research Institute, St. Petersburg, Russia
Email: svetlana.gratowski@yandex.ru

PDF
Investigation of the genetic and breeding orientation have shown that it is inefficient to study the genotype-environment (GTE) interaction in plants at the molecular level, since the GTE effect disappears without a trace on it, being an emergent property that occurs when gene products interact with labile ones during the day, weeks, months by limiting environmental factors. Such studies should be carried out for higher system levels, namely, at the next stages of life organization - organismal, population, ecological, phytocenotic. Since the most powerful "lever" for increasing plant productivity and yield, GTE, cannot be traced at the molecular level, knowledge of the molecular structures of the genome without knowledge of the dynamics of limiting environmental factors and the interaction of gene products with them does not contribute to the creation of high technologies for ecological genetic increase in productivity and yield plants. The accumulated world experience shows that rapid methods for measuring traits in plants, which give a holistic characterization of a complex dynamic system (this is what GTE is), can be created by interdisciplinary approaches, primarily using physical measurement methods. Within this approach, the article proposes to use the method of millimeter (MM) wave spectroscopy, which is very sensitive to changes in the water supply of plant tissues for the selection of drought-resistant plants. Keywords: plant productivity, principle of background traits, moisture content, millimeter wave spectroscopy.
  1. V.A. Dragavtsev, I.M. Mikhailenko, M.A. Proskuriakov. Selskokhozyastvennaya biologiya, 52, 487 (2017) (in Russian). DOI: 10.15389/agrobiology.2017.3.487rus
  2. V.A. Dragavtsev, P.P. Litun, N.M. Shkel, N.N. Netchiporenko. DAN SSSR, 274 (3), 720 (1984) (in Russian)
  3. N.V. Kocherina, V.A. Dragavtsev. Vvedenie v teoriyu ekologo-geneticheskoi organizatsii poligennykh priznakov rasteniy i teoriyu selektsionnykh indeksov (STsDB, SPb., 2008)
  4. V. Dragavtsev, J. Pesek. In: Genetic Diversity in Plants. Encyclopedia of Basic Life Science, ed. by A. Muhammed, R. Aksel, R.C. von Borstel. (Plenum Press., NY., London, 1977), v. 8. p. 233
  5. R.T. Furbank, M. Tester. Trends Plant Sci., 16 (12), 635 (2011). DOI: 10.1016/j.tplants.2011.09.005
  6. I.R. Cowan. J. Appl. Ecol., 2 (1), 221 (1965). DOI: 10.2307/2401706
  7. D.R. Brunfeldt, F.T. Ulaby. IEEE Tr. Geosci. Remote, 6, 520 (1984). DOI: 10.1109/TGRS.1984.6499163
  8. F.T. Ulaby, R.P. Jedlicka. IEEE Tr. Geosci. Remote, 4, 406 (1984). DOI: 10.1109/TGRS.1984.350644
  9. F.T. Ulaby, M.A. El-Rayes. IEEE Tr. Geosci. Remote, 5, 550-557 (1987). DOI: 10.1109/TGRS.1987.289833
  10. M.A. El-Rayes, F.T. Ulaby. IEEE Tr. Geosci. Remote, 5, 541-549 (1987). DOI: 10.1109/TGRS.1987.289832
  11. S. Trabelsi, M. Ghomi, J.C. Peuch, H. Baudrand. In: Proceedings of The 22nd European Microwave Conference (Helsinki, Finland, 2002), v. 2, p. 1234. DOI: 10.1109/EUMA.1992.335873
  12. C. Matzler. IEEE Tr. Geosci. Remote, 32 (4), 947 (1994). DOI: 10.1109/36.298024
  13. J. Liao, H. Guo, Y. Shao. In: Proceedings of the IEEE International Geoscience and Remote Sensing Symposium (Toronto, Ontario, Canada, 2002), v. 5, p. 2620. DOI: 10.1109/IGARSS.2002.1026720
  14. S.O. Nelson. In: Proceedings of The 2003 ASAE Annual Meeting (Las Vegas, NV, USA, 2003), DOI: 10.13031/2013.14075
  15. S.O. Nelson. In: Proceedings of The IEEE Antennas and Propagation Society International Symposium. Digest. Held in conjunction with: USNC/CNC/URSI North American Radio Sci. Meeting (Columbus, OH, USA, 2003), v. 4, p. 46. DOI: 10.1109/APS.2003.1220116
  16. A.W. Kraszewski, S.O. Nelson. J. Microwave Power EE, 39 (1), 41 (2004). DOI: 10.1080/08327823.2004.11688507
  17. S.O. Nelson. J. Microwave Power EE, 40 (1), 31(2005). DOI: 10.1080/08327823.2005.11688523
  18. S.O. Nelson. In: Proceedings of The 2005 IEEE Instrumentationand Measurement Technology Conference (Ottawa, ON, Canada, 2005), v. 1, p. 360. DOI: 10.1109/IMTC.2005.1604135
  19. S.O. Nelson. In: Proceedings of The 2005 IEEE Antennas and Propagation Society International Symposium (Washington, DC, USA, 2005), v. 4, p. 455. DOI: 10.1109/APS.2005.1552849
  20. T. Shimomachi, S. Ou, Y. Ichimaru, S. Cho, T. Takemasa, S. Yamayaki, T. Takakura. Environ. Control Biol., 43 (1), 47 (2005). DOI: 10.2525/ecb.43.47
  21. D. Jamaludin, S. Abd Aziz, N.U.A. Ibrahim. Int. J. Environ. Sci. Dev., 5 (3), 286 (2014). DOI: 10.7763/IJESD.2014.V5.493
  22. A. Kundu, B. Gupta. In: Proceedings of The 2014 International Conference on Control, Instrumentation, Energy and Communication (CIEC) (Calcutta, India, 2014), p. 480. DOI: 10.1109/CIEC.2014.6959135
  23. R. Vijay, R. Jain, K.S. Sharma. J. Environ. Nanotechnol., 3 (1), 43 (2014). DOI: 10.13074/jent.2014.01.132035
  24. J.Y. Zeng, Z. Li, Z.H. Tang, Q. Chen, H.Y. Bi, L.B. Zhao. IOP Conf. Ser. Earth Environ. Sci., 17 (1), 012055 (2014). DOI: 10.1088/1755-1315/17/1/012055
  25. D.E. Khaled, N. Novas, J.A. Gazquez, R.M. Garcia, F. Manzano-Agugliaro. Sensors, 15 (7), 15363 (2015). DOI: 10.3390/s150715363
  26. S. Dadshani, A. Kurakin, S. Amanov, B. Hein, H. Rongen, S. Cranstone, U. Blievernicht, E. Menzel, J. Leon, N. Klein, A. Ballvora. Plant Methods, 11 (1), 1 (2015). DOI: 10.1186/s13007-015-0054-x
  27. R. Gente, A. Rehn, M. Koch. J. Infrared Millim. Terahertz Waves, 36 (3), 312 (2015). DOI: 10.1007/s10762-014-0127-3
  28. H. Krraoui, F. Mejri, T. Aguili. J. Electromagnet. Wave., 30 (12), 1643 (2016). DOI: 10.1080/09205071.2016.1208592
  29. D. El Khaled, N.N. Castellano, J.A. Gazquez, A.J. Perea-Moreno, F. Manzano-Agugliaro. Materials, 9 (5), 310 (2016). DOI: 10.3390/ma9050310
  30. E.M. Cheng, A.B. Shahriman, H.A. Rahim, M.F. Abdul Malek, N.F. Mohd Nasir, N. Abdulaziz, M.S. Abdul Majid, K.S. Basaruddin. J. Telecommun. Electron. Comput. Eng., 10 (1-14), 1 (2018)
  31. M. Kafarski, A. Wilczek, A. Szyp owska, A. Lewandowski, P. Pieczywek, G. Janik, W. Skierucha. Sensors, 18 (1), 121 (2018). DOI: 10.3390/s18010121
  32. A.G. Konings, K. Rao, S.C. Steele-Dunne. New Phytologist, 223 (3), 1166 (2019). DOI: 10.1111/nph.15808
  33. B. Colak. Microw. Opt. Techn. Lett., 61 (11), 2591 (2019). DOI: 10.1002/mop.31932
  34. C.M.O. Muvianto, K. Yuniarto, S. Ariessaputra, B. Darmawan, M. Yadnya, A. Rachman. In: Proceedings International Conference on Science and Technology (ICST) (2020), v. 1
  35. P.F. Silva, E.E. Santana, M.S.S. Pinto, E.P. Andrade, J.N. Carvalho, R. Freire, M.A. Oliveira, E.E. Oliveira. J. Microw. Optoelectron. Electromagn. Appl., 19, 86 (2020). DOI: 10.1590/2179-10742020v19i11868
  36. F.V. Di Girolamo, A. Toncelli, A. Tredicucci, M. Bitossi, R. Paoletti. J. Phys. Conf. Ser., 1548 (1), 012002 (2020). DOI: 10.1088/1742-6596/1548/1/012002
  37. H. Dogan, I.B. Basyigit, A. Genc. J. Microwave Power EE, 54 (3), 254 (2020). DOI: 10.1080/08327823.2020.1794724
  38. R. Li, Y. Lu, J.M. Peters, B. Choat, A.J. Lee. Sci. Rep., 10 (1), 1 (2020). DOI: 10.1038/s41598-020-78154-z
  39. C. Quemada, J.M. Perez-Escudero, R. Gonzalo, I. Ederra, L.G. Santesteban, N. Torres, J.C. Iriarte. Remote Sens., 13 (11), 2088 (2021). DOI: 10.3390/rs13112088
  40. S. Metlek, K. Kayaalp, I.B. Basyigit, A. Genc, H. Dogan. Int. J. RF Microw. CE, 31 (1), e22496 (2021). DOI: 10.1002/mmce.22496
  41. V.V. Meriakri. In: Proceedings of The 2000 Material Research Society Spring Meeting, Symp AA.Paper AA2.6 (San Francisco, USA, 2000), DOI: 10.1557/PROC-631-AA2.6

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru