Physics of the Solid State
Volumes and Issues
Electronic nature of size effects in O2-Yb-Si(111) film structures
Kuzmin M.V. 1
1Ioffe Institute, St. Petersburg, Russia
Email: m.kuzmin@mail.ioffe.ru

PDF
Using X-ray photoelectron spectroscopy, the effect of the nanoadsorbent size (ytterbium film thickness ranging from ~ 0.8 to 12.2 nm) on the properties of the adsorbed molecular oxygen layer, in particular, the saturate coverage, and the adsorption configuration and polarization of molecules on the surface, has been studied. It is shown that the size dependences obtained are due to electronic processes in the bulk and at the surface of ytterbium, occurring during the formation of bonding between the nanofilm and the adsorption layer. The results appear important for the development of physical principles and methods for creating materials with tailored properties. Keywords: adsorbed layer, nanoadsorbent, oxygen, ytterbium, X-ray photoelectron spectroscopy.
  1. T.A. Saleh. Surface science of adsorbents and nanoadsorbents. In: Interface Science and Technology. Elsevier, Academic Press (London). Vol. 34. (2022). 324 p
  2. Synthesis and modification of nanostructured thin films. Ed. I.N. Mihailescu. MDPI (Basel). (2020). 261 p
  3. A. Kasprzak, M. Matczuk, H. Sakurai. Chem. Commun. 59, 9591 (2023)
  4. A.E. Ferenj, D.M. Kabtamu, A.H. Assen, G. Gedda, A.A. Muhabie, M. Berrada, W.M. Girma, ACS Omega 9, 6803 (2024)
  5. R. Ningthoujam, Y.D. Singh, P.J. Babu, A. Tirkey, S. Pradhan, M. Sarma, Chemical Physics Impact 4, 100064 (2022)
  6. D.V. Buturovich, M.V. Kuzmin, M.V. Loginov, M.A. Mitsev. FTT 57, 9, 1821 (2015). (in Russian)
  7. M.V. Kuzmin, M.A. Mitsev, N.M. Blashenkov. FTT 59, 8, 1612 (2017). (in Russian)
  8. M.V. Kuz'min, M.A. Mitsev, ZhTF 91, 7, 1189 (2021). (in Russian)
  9. M.V. Kuz'min, M.A. Mitsev, FTT 64, 7, 874 (2022). (in Russian)
  10. M.V. Kuzmin, M.A. Mitsev, A.A. Monyak, S.V. Sorokina. FTT 66, 5, 775 (2024). (in Russian)
  11. M.V. Kuz'min, M.A. Mitsev, ZhTF 90, 8, 1359 (2020). (in Russian)
  12. L.I. Johansson, J.W. Allen, I. Lindau, M.H. Hecht, S.B.M. Hagstrom. Phys. Rev. B 21, 4, 1408 (1980)
  13. D.A. Shirley. Phys. Rev. B 5, 4709 (1972)
  14. G.H. Major, N. Farley, P.M.A. Sherwood, M.R. Linford, J. Terry, V. Fernandez, K. Artyushkova. J. Vac. Sci. Technol. A 38, 061203 (2020)
  15. G. Adachi, N. Imanaka. Chem. Rev. 98, 1479 (1998).
  16. M.V. Kuz'min, M.A. Mitsev, FTT 65, 6, 1082 (2023). (in Russian)
  17. A.W. Newton, A. Vaughan, R.J. Cole, P. Weightman, J. Electron Spectrosc. Related Phenom. 107, 2, 185 (2000)
  18. A.W. Newton, S Haines, P. Weightman, R.J. Cole, J. Electron Spectrosc. Related Phenom. 136, 3, 235 (2004)
  19. T. Marten, W. Olovsson, S.I. Simak, I.A. Abrikosov, Phys. Rev. B 72, 054210 (2005)
  20. J. Liu, H. Zhang, Y. Li, Z. Liu, J. Phys. Chem. B 122, 46, 10600 (2018)
  21. G. Grey. Elektrony i khimicheskaya svyaz'. Mir, M. (1967), s. 72. (in Russian).
Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru