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Measurement of step heights on a crystal surface using synchrotron phase contrast imaging
Argunova T. S.
1, Kohn V.G.
2, Lim J.-H.3, Krymov V.M.
1, Ankudinov A.V.
1
1Ioffe Institute, St. Petersburg, Russia
2National Research Center “Kurchatov Institute”, Moscow, Russia
3Pohang Accelerator Laboratory, POSTECH, Pohang, Korea
2National Research Center “Kurchatov Institute”, Moscow, Russia
3Pohang Accelerator Laboratory, POSTECH, Pohang, Korea
Email: argunova@mail.ioffe.ru, kohnvict@yandex.ru, limjh@postech.ac.kr, v.krymov@mail.ioffe.ru, Alexander.Ankudinov@mail.ioffe.ru
An experimental and theoretical study of surface step heights on a basal-faceted sapphire ribbon grown using the Stepanov's method was carried out. Obtained results were compared with atomic force microscopy data. We established that the step heights on the order of 1 μm could be determined using simple in-line phase-contrast imaging setup. Keywords: synchrotron radiation, phase contrast, microrelief, sapphire, Stepanov's method.
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