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Analysis of optical properties of disordered array of hemispherical Ag nanoparticles on SiO2/c-Si by spectroscopic ellipsometry
Russian version
Ermina A. A.1, Bolshakov V.O.1, Prigoda K. V.1, Tolmachev V. A.1, Grudinkin S. A.1, Zharova Yu. A.1
1Ioffe Institute, St. Petersburg, Russia
Email: annaermina97@gmail.com, lion080895@gmail.com, kristina_prigoda@mail.ru, tva@mail.ioffe.ru, grudink.gvg@mail.ioffe.ru, piliouguina@mail.ioffe.ru
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In this work, a disordered array of self-organized hemispherical Ag nanoparticles on a SiO_2/Si surface was studied. The structures were obtained by a simple, reproducible and low-cost method based on the reduction of Ag from solution on the silicon surface, followed by annealing in an O2 atmosphere at 350oC. Experimental data are analyzed using the Bruggeman effective medium approximation and Lorentz oscillators which determined the volume fraction of Ag and plasmon resonances positions, respectively. The numerical spectral positions of localized surface plasmon resonances are in good agreement with the data obtained by spectroscopic ellipsometry. Keywords: hemispherical Ag nanoparticles, single-crystal silicon, localized surface plasmon resonance, spectroscopic ellipsometry, effective medium approximation.
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