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Photoluminescence of sapphire irradiated by low-energy electrons and ions
Russian version
DOI: 10.21883/EOS.2022.09.54827.3397-22
Zykova E.Yu.1, Ozerova K.E.1, Tatarintsev A.A.1, Turkin A. N. 1
1Lomonosov Moscow State University, Moscow, Russia
Email: zykova@phys.msu.ru, kemark@mail.ru, tatarintsev@physics.msu.ru, andrey@turkin.su
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Photoluminescence (PL) of sapphire single crystals as received and preirradiated by low energy Ar+ ions and electrons has been studied to reveal a relationship between sapphire charging under electron beam irradiation and radiation-induced defect formation. The photoluminescence spectra were obtained using a confocal microscope excitation wavelength of 445 nm as well as by a nonconfocal method with excitation at a wavelength of 355 nm. The lines observed in PL spectra for all samples are associated with both intrinsic and impurity defects. It has been established that preliminary ion irradiation leads to disordering of the near-surface region of the sample resulting in a significant increase in the photoluminescence intensity. Preliminary electron irradiation can lead to a change in the charge state of defects that initially exist in the crystal. Keywords: radiation-stimulated defects, sapphire photoluminescence, ion and electron irradiation.
  1. E.I. Rau, A.A. Tatarintsev, E.Yu. Zykova, I.P. Ivanenko, S.Yu. Kupreenko, K. F. Minnebaev, A.A. Haidarov. Phys. Solid State, 59 (8), 1526 (2017). DOI: 10.1134/S1063783417080212
  2. E.I. Rau, A.A. Tatarintsev. FTT, 63 (4), 483 (2021). (in Russian). DOI: 10.21883/EOS.2022.09.54827.3397-22 [E.I. Rau, A.A. Tatarintsev. Phys. Solid State, 63 (4), 574 (2021). DOI: 10.1134/S1063783421040181]
  3. E.I. Rau, A.A. Tatarintsev, E.Yu. Zykova. Nucl. Instr. and Meth. in Phys. Res. B, 460, 141 (2019). DOI: 10.1016/j.nimb.2018.12.030
  4. D.I. Bletskan, V.Y. Bratus', A.R. Luk'yanchuk, V.T. Maslyuk, O.A. Parlag. Tech. Phys. Lett., 34, 612 (2008). DOI: 10.1134/S1063785008070237
  5. B.D. Evans, G.J. Pogatshnik, Y. Chen. Nucl. Instr. and Meth. in Phys. Res. B, 91, 258 (1994). DOI: 10.1016/0168-583X(94)96227-8
  6. M. Rodriguez, G. Denis, M. Akselrod, T. Underwood, E. Yukihara. Radiation Measurements, 46, 1469 (2011). DOI: 10.1016/J.RADMEAS.2011.04.026
  7. V.S. Kortov, V.A. Pustovarov, T.V. Shtang. Radiation Measurements, 85, 51 (2016). DOI: 10.1016/J.RADMEAS.2015.12.009
  8. H. Arendt, J. Hulliger. Crystal Growth in Science and Technology (Plenum Press., New York, 1989), p. 275-302. DOI: 10.1007/978-1-4613-0549-1
  9. R. Mogilevsky, S. Nedilko, L. Sharafutdinova, S. Burlay, V. Sherbatskii, V. Boyko, S.D. Mittl. Opt. Mater., 31, 1880 (2009). DOI: 10.1016/J.OPTMAT.2008.11.023
  10. A.I. Kostyukov, A.V. Zhuzhgov, V.V. Kaichev, A.A.Rastorguev, V.N.Snytnikov, V.N. Snytnikov. Optical Materials, 75, 757 (2018). DOI: 10.1016/J.OPTMAT.2017.11.040
  11. Y. Wang, P.D. Townsend. J. Luminescence, 142, 202 (2013). DOI: 10.1016/j.jlumin.2013.03.052
  12. E. Liver. Elektronnaya spektroskopiya neorganicheskih soedineniy (Mir, M., 1987), p. 2. (in Russian)
  13. J. Valbis, N. Itoh. Radiat. Eff. Defects Solids, 116, 171 (1991). DOI: 10.1080/10420159108221357
  14. A.I. Surdo, V.A. Pustovarov,V.S. Kortov, A.S. Kishka, E.I. Zinin. Nucl. Instrum. Methods Phys. Res. Sect. A: Accel. Spectrom. Detect. Assoc. Equip., 543, 234 (2005). DOI: 10.1016/j.nima.2005.01.189
  15. I. Tale, T.M. Piters, M. Barboza-Flores, R. Perez-Salas, R. Aceves, M. Springis. Radiat. Prot. Dosim., 65, 235 (1996). DOI: 10.1093/OXFORDJOURNALS.RPD.A031630
  16. V.S. Kortov, S.V. Zvonarev, A.I. Medvedev. J. Lumin., 131, 1904 (2011). DOI: 10.1016/j.jlumin.2011.05.006
  17. M.S. Akselrod, A.E. Akselrod, S.S. Orlov, S. Sanyal, T.H. Underwood. J. Fluorescence, 13 (6), 503 (2003). DOI: 10.1023/B:JOFL.0000008061.71099.55
  18. S.V. Soloviev, I.I. Milman, A.I. Surdo. Phys. Solid State, 54 (4), 683 (2012). DOI: 10.1134/S1063783412040270
  19. K.S. Jheeta, B.C. Jain, Ravi Kumar, K.B. Garg. Ind. J. Pure Appl. Phys., 46, 400 (2008)
  20. M.F. Zhang, H.L. Zhang, J.C. Han, H.X. Guo, C.H. Xu, G.B. Ying, H.T. Shen, N.N. Song. Physica B, 406 (3), 494 (2011). DOI: 10.1016/j.physb.2010.11.021
  21. O.V. Rakhovskaya, S.S. Elovikov, E.M. Dubinina, E.S. Shakhurin, A.P. Dementjev. Surf. Sci., 274, 190 (1992). DOI: 10.1016/0039-6028(92)90113-K
  22. M.L. Knotek, P.J. Feibelman. Phys. Rev. Lett., 40, 964 (1978). DOI: 10.1103/PhysRevLett.40.964
  23. The Stopping and Range of Ions in Matter Software. URL: http://www.srim.org

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