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h-BN surface modification by scanning probe microscope
Gushchina E. V.1, Malykh D. A1, Dunaevskiy M. S. 1
1Ioffe Institute, St. Petersburg, Russia
Email: katgushch@yandex.ru

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The study demonstrates the possibility of modifying fragments of hexagonal boron nitride layers by bending them with a probe using a scanning probe microscope. The specific ranges of h-BN fragments with a lateral size of about 1 micron have been determined. It was possible to obtain a layer up to 8 monolayers thick from initially thick fragments of h-BN by the layer flip method. Keywords: Hexagonal boron nitride, atomic force microscopy.
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