Physics of the Solid State
Volumes and Issues
Crystal structure, nanostructure, and dielectric characteristics of 0.91NaNbO3-0.09SrZrO3 films grown on a (001)SrTiO3(0.5% Nb) substrate
Matyash Ya. Yu. 1, Stryukov D. V. 1, Pavlenko A. V. 1,2, Ter-Oganessian N. V. 2
1Federal Research Center Southern Scientific Center of the Russian Academy of Sciences, Rostov-on-Don, Russia
2Southern Federal University, Research Institute of Physics, Rostov-on-Don, Russia
Email: matyash.ya.yu@gmail.com, strdl@mail.ru, tolik_260686@mail.ru, teroganesyan@sfedu.ru

PDF
The structure, nanostructure, and properties of a 0.91NaNbO3-0.09SrZrO3 thin film with a thickness of ~30 nm, grown by RF cathode sputtering in an oxygen atmosphere on a (001)SrTiO3(0.5%Nb) substrate, have been studied. According to X-ray diffraction data, a significant tensile strain of the unit cell, which reaches 4.8%, occurs in the film in the direction perpendicular to the substrate. It is shown, that the likely film growth mechanism is the Frank-van der Merwe mechanism. The results of studying the dielectric hysteresis loops of the film in fields up to 833 kV/cm and its piezoactivity using atomic force microscopy indicated the presence of a ferroelectric response in it. Possible reasons for the identified features are discussed. Keywords: antiferroelectric, NaNbO3, SrZrO3, atomic force microscopy, X-ray diffraction, dielectric spectroscopy.
  1. Z. Liu, T. Lu, J. Ye, G. Wang, X. Dong, R. Withers, Y. Liu. Adv. Mater. Technol. 3, 9, 1800111 (2018)
  2. X. Tan, Ch. Ma, J. Frederick, S. Beckman, K.G. Webber. J. Am. Ceram. Soc. 94, 12, 4091 (2011)
  3. N. Izyumskaya, Y.-I. Alivov, S.-J. Cho, H. Morko c, H. Lee, Y.-S. Kang. Crit. Rev. Solid State Mater. Sci. 32, 3-4, 111 (2007)
  4. European Commission. Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the restriction of the use of certain hazardous substances in electrical and electronic equipment (recast). Off. J. Eur. Union 1, 88 (2011)
  5. H.D. Megaw. Ferroelectrics 7, 1, 87 (1974)
  6. L.E. Cross, B.J. Nicholson. The London, Edinburgh, and Dublin Phil. Mag. J. Sci. 46, 376, 453 (1955)
  7. A.M. Glazer, H.D. Megaw. Acta Cryst. 29, 5, 489 (1973)
  8. E.A. Wood, R.C. Miller, J.I. Remeika. Acta Cryst. 15, 1273 (1962)
  9. H. Guo, H. Shimizu, Y. Mizuno, C.A. Randall. J. Appl. Phys. 117, 21, 214103 (2015)
  10. H. Shimizu, H. Guo, S.E. Reyes-Lillo, Y. Mizuno, K.M. Rabe, C.A. Randall. Dalton Trans. 44, 23, 10763 (2015)
  11. I. Fujii T. Shimasaki, T. Nobe, H. Adachi, T. Wada. Jpn. J. Appl. Phys. 57, 11S, 11UF13 (2018)
  12. A.V. Pavlenko, S.P. Zinchenko, D.V. Stryukov, A.P. Kovtun, Nanorazmernye plenki niobata bariya-strontsiya: osobennosti polucheniya v plazme vysokochasotnogo razryada, struktura i fizicheskie svoistva. Izdatelstvo YuNTs RAN, Rostov-na-Donu (2022). 244 s. (in Russian)
  13. A.V. Pavlenko, D.V. Stryukov, V.G. Smotrakov, E.V. Glazunova, Yu.A. Kuprina, N.V. Ter-Oganessian. Ferroelectrics 590, 1, 227 (2022)
  14. A.R. Shugurov, A.V. Panin. ZhTF 90, 12, 1971, (2020). (in Russian)
  15. P.E. Janolin. J. Mater. Sci. 44, 5025 (2009)
  16. A.V. Pavlenko, D.A. Kiselev, Ya.Yu. Matyash, FTT 63, 6, 776 (2021). (in Russian)
  17. K. Beppu, T. Shimasaki, I. Fujii, T. Imai, H. Adachi, T. Wada. Phys. Lett. A 384, 27, 126690 (2020)
  18. R. Meyer, R. Waser, K. Prume, T. Schmitz, S. Tiedke. Appl. Phys. Lett. 86, 14, 142907 (2005)
  19. J.F. Scott. J. Phys.: Condens. Matter 20, 2, 021001 (2007)
  20. K.J. Choi, M. Biegalski, Y.L. Li, A. Sharan, J. Schubert, R. Uecker, P. Reiche, Y.B. Chen, X.Q. Pan, V. Gopalan, L.-Q. Chen, D.G. Schlom, C.B. Eom. Science 306, 5698, 1005 (2004)
  21. D. Lebeugle, D. Colson, A. Forget, M. Viret. Appl. Phys. Lett. 91, 2, 022907 (2007)
  22. J. Li, J. Wang, M. Wuttig, R. Ramesh, N. Wang, B. Ruette, A.P. Pyatakov, A.K. Zvezdin, D. Viehland. Appl. Phys. Lett. 84, 25, 5261 (2004)
  23. Y.H. Lee, H.J. Kim, T. Moon, K.D. Kim, S.D. Hyun, H.W. Park, Y.B. Lee, M.H. Park C.S. Hwang. Nanotechnology 28, 30, 305703 (2017)

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru