Experimental implementation of a spectral refractive index sensor based on a reflection interferometer
Terentyev V.S. 1, Simonov V.A. 1
1Institute of Automation and Electrometry, Siberian BranchRussian Academy of Sciences, Novosibirsk, Russia
Email: terentyev@iae.nsk.su

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Experimental study of the sensor in the Kretschmann optical scheme, in which the sensitive element is a reflection interferometer (RI) for the oblique incidence of light, is presented for the first time. A brief theory of RI is given. The experimental sample was used to measure the refractive index of the residual atmosphere in a vacuum chamber during its pumping. The high Q-factor of the RI resonator made it possible to obtain a fairly narrow spectral maximum with a width of 1.7 nm. The spectral sensitivity of the sensor was 1000 nm/RIU and the quality parameter was 529 RIU-1, it was also demonstrated that resolution of 6.5·10-8 RIU can be achieved. Proposals for further improvement of the sensor characteristics are formulated. Keywords: reflection interferometer, total internal reflection, refractive index sensor.
  1. J. Homola. Surface Plasmon Resonance Based Sensors (Springer, 2006). DOI: 10.1007/b100321
  2. J. Jing., K. Liu, J. Jiang, T. Xu, S. Wang, J. Ma, Z. Zhang, W. Zhang, T. Liu. Photon. Res., 10, 126--147 (2022). DOI: 10.1364/PRJ.439861
  3. M. Printz, J.R. Sambles. J. Modern Optics, 40 (11), 2095 (1993). DOI: 10.1080/09500349314552131
  4. R. Boruah, D. Mohanta, A. Choudhury, G.A. Ahmeda. Opt. Mater., 39, 273 (2015). DOI: 10.1016/j.optmat.2014.11.014
  5. V.S. Terent'ev, V.A. Simonov. Opt. Spectrosc., 129 (8), 1091 (2021). DOI: 10.1134/S0030400X21080191
  6. N.D. Goldina. J. Opt. Technol., 89 (2), 71 (2022). DOI: 10.1364/JOT.89.000071
  7. P.F. Egan, J.A. Stone, J.K. Scherschligt, A.H. Harvey. J. Vacuum Sci. Technol. A, 37, 031603 (2019). DOI: 10.1116/1.5092185
  8. D. Mari, M. Bergoglio, M. Pisani, M. Zucco. Measur. Sci. Technol., 25 (12), 125303 (2014). DOI: 10.1088/0957-0233/25/12/125303
  9. Y. Clergent, C. Durou, M. Laurens. J. Chem. Eng. Data, 44, 197 (1999). DOI: 10.1021/je980133o
  10. A.D. Kersey, M.A. Davis, H.J. Patrick, M. LeBlanc, K.P. Koo, C.G. Askins, E.J. Friebele. J. Lightwave Technol., 15 (8), 1442 (1997). DOI: 10.1109/50.618377
  11. L. Rahimi, A.A. Askari. Appl. Opt., 59 (34), 10980 (2020). DOI: 10.1364/AO.405129

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