Optics and Spectroscopy
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Ir transparency of thin bismuth films
The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated. Keywords: bismuth, film, IR, interference.
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Дата начала обработки статистических данных - 27 января 2016 г.