Optics and Spectroscopy
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Investigation of dielectric functions of a layer of Ag nanoparticles on silicon using spectro-ellipsometry and spectrophotometry
Tolmachev V. A.
1, Zharova Yu. A.
1, Ermina A. A.
1, Bolshakov V.O.
1
1Ioffe Institute, St. Petersburg, Russia
Email: tva@mail.ioffe.ru, piliouguina@mail.ioffe.ru, annaermina97@gmail.com, lion080895@gmail.com
An investigation of the optical characteristics of a layer of Ag nanoparticles deposited from an AgNO3 solution on the surface of single-crystal Si is presented. The measurements were carried out using spectroscopic ellipsometry and spectrophotometry at the same tilt angle and sample probe location in a wide spectral range from 200 to 1700 nm. From the obtained experimental data, the parameters of the Drude-Lorentz model and the complex dielectric function were determined, which was compared with the pseudo-dielectric function. Both dependences revealed resonances of a bulk plasmon near the energy E = 3.8 eV, while a localized plasmon was detected in the pseudo-dielectric function at E = 1.65 eV, and in the dielectric function at E = 1.84 eV. Keywords: dielectric function, Drude-Lorentz model, silver nanoparticles, plasmon, pseudo-dielectric function, spectrophotometry, ellipsometry
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