Optics and Spectroscopy
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- 2023
- 2022
Investigation of dielectric functions of a layer of Ag nanoparticles on silicon using spectro-ellipsometry and spectrophotometry
Tolmachev V. A.
1, Zharova Yu. A.
1, Ermina A. A.
1, Bolshakov V.O.
1
1Ioffe Institute, St. Petersburg, Russia
Email: tva@mail.ioffe.ru, piliouguina@mail.ioffe.ru, annaermina97@gmail.com, lion080895@gmail.com
An investigation of the optical characteristics of a layer of Ag nanoparticles deposited from an AgNO3 solution on the surface of single-crystal Si is presented. The measurements were carried out using spectroscopic ellipsometry and spectrophotometry at the same tilt angle and sample probe location in a wide spectral range from 200 to 1700 nm. From the obtained experimental data, the parameters of the Drude-Lorentz model and the complex dielectric function were determined, which was compared with the pseudo-dielectric function. Both dependences revealed resonances of a bulk plasmon near the energy E = 3.8 eV, while a localized plasmon was detected in the pseudo-dielectric function at E = 1.65 eV, and in the dielectric function at E = 1.84 eV. Keywords: dielectric function, Drude-Lorentz model, silver nanoparticles, plasmon, pseudo-dielectric function, spectrophotometry, ellipsometry
- S.A. Maier. Plasmonics: Fundamentals and Applications (Springer Science+Business Media LLC, NY, 2007)
- M.I. Stockman. Science, 348 (6232), 287 (2015). DOI: 10.1126/science.aaa6805
- H.A. Atwater, A. Polman. Nature Materials, 9 (3), 205 (2010). DOI: 10.1038/nmat2629
- V.M. Shalaev. Nat. Photonics, 1 (1), 41 (2007). DOI: 10.1038/nphoton.2006.49
- Y. Wang, E.W. Plummer, K. Kempa. Adv. Phys., 60 (5), 799 (2011). DOI: org/10.1080/00018732.2011.621320
- M.I. Stockman, K. Kneipp, S.I. Bozhevolnyi et al. J. Opt., 20 (4), 043001 (2018). DOI: org/10.1088/2040-8986/aaa114
- T.W.H. Oates, H. Wormeester, H. Arwin. Progr. Surf. Sci., 86 (11-12), 328 (2011). DOI: org/10.1016/j.progsurf.2011.08.004
- A. Hilgerm, M. Tenfeldeu, U. Kreibig. Appl. Phys. B., 73 (4), 361 (2001). DOI: 10.1007/s003400100712
- V.A. Kosobukin. Phys. Sol. St., 54 (12), 2471 (2012)
- R.M.A. Azzam, N.M. Bashara. Ellipsometry and Polarized Light (North-Holland Publ. Co., Amsterdam-NY.-Oxford, 1977) (M.: Mir, 1981).] (in Russian)
- H. Fujiwara. Spectroscopic Ellipsometry. Principles and Applications (Wiley John \& Sons Ltd., England, 2007)
- Yu.A. Zharova, V.A. Tolmachev, A.I. Bednaya, S.I. Pavlov. Semicond., 52 (3), 316 (2018). DOI: org/10.1134/S1063782618030235
- H.U. Yang, J. D'Archangel, M.L. Sundheimer, E. Tucker, G.D. Boreman, M.B. Raschke. Phys. Rev. B., 91 (23), 235137 (2015). DOI: org/10.1103/PhysRevB.91.235137
- Handbook of Optical Constants of Solids. Ed. by E.D. Palik (Academic Press, NY., 1985)
- V.A. Tolmachev, Yu.A. Zharova, S.A. Grudinkin. Opt. i spektr., 128 (12), 1868 (2020) (in Russian). DOI: 10.21883/OS.2020.12.50324.211-20; V.A. Tolmachev, Yu.A. Zharova, S.A. Grudinkin. Optics and Spectroscopy, 128 (12), 2002 (2020). https://doi.org/10.1134/S0030400X20121066
- D.E. Aspnes. Thin Solid Films, 89 (3), 249 (1982). DOI: org/10.1016/0040-6090(82)90590-9
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