Microdomain structures investigation in LNOI thin films of different thickness using an AFM tip
Bodnarchuk Ya.V.1, Gainutdinov R.V.
1
1National Research Center “Kurchatov Institute”, Moscow, Russia
Email: deuten@mail.ru, rgaynutdinov@gmail.com
The results of domain recording and evolution using an AFM tip were obtained for three film thickness: 300 nm, 500 nm, 700 nm. It was shown that domain growth and formation depend significantly on the thickness of the thin films waveguide layer. At minimum recording voltages, stable and regular domains are recorded in waveguides with thicknesses of 300 and 500 nm, but this regularity and stability are not observed in a thin film of 700 nm with the same recording parameters Domain coalescence has been studied, which depends both on the recording period between domains and on the thickness of the thin film. Keywords: domain structure, thin film, atomic force microscopy, lithium niobate.
- T. Volk, M. Wohlecke. Lithium niobate: defects, photorefraction and ferroelectric switching. Springer-Verlag, Berlin, Heidelberg (2008). 250 p.
- P. Ferraro, S. Grilli, P. De Natale. Ferroelectric Crystals for Photonic Applications, Including Nanoscale Fabrication and Characterization Techniques. Springer Series in Materials Science. (2009). 424 p
- D. Sun, Y. Zhang, D. Wang, W. Song, X. Liu, J. Pang, D. Geng, Y. Sang, H. Liu. Light Sci. Appl. 9, 197 (2020)
- J.J. Chakkoria, A. Dubey, A. Mitchell, A. Boes. Opto-Electron. Adv. 8, 240139 (2025)
- A. Rao, S. Fathpour. IEEE J. Sel. Topics Quant. Electron., 24, 6, 4843--4855 (2018)
- R.V. Gainutdinov, T.R. Volk, H. Zhang. Appl. Phys. Lett. 107, 162903 (2015)
- T.R. Volk, R.V. Gainutdinov, H. Zhang. Appl. Phys. Lett. 110, 132905 (2017)
- T.R. Volk, R.V. Gainutdinov, H. Zhang. Crystals 7, 137 (2017)
- R. Gainutdinov, T. Volk. Crystals 10, 1160 (2020)
- I. Krasnokutska, J.L.J. Tambasco, A. Peruzzo. arXiv:2108.10839 (2021). doi.org/10.48550/arXiv.2108.10839
- B.N. Slautin, H. Zhu, V.Y. Shur. Ferroelectrics 576, 119--128 (2021)
- B. Slautin, H. Zhu, V.Y. Shur. Ceram. Int. |bf47, 32900--32904 (2021)
- R. Huang, X. Zhang, M. Tang, R. Li, H. Xu, Y. Guo, Zh. Wang. Vacuum 227, 113353 (2024)
- E. Lang, Th. Beechem, A. McDonald, T. Friedmann, R.H. Olsson, J.O. Stevens, B.G. Clark, K. Hattar. Thin Solid Films 768, 139719 (2023)
- P.D. Townsend, P.J. Chandler, L. Zhang. Cambridge Univ. Press, Cambridge, UK. (1994). 296 p
- F. Chen, X.L. Wang, K.M. Wang. Opt. Mat. 29, 1523--1542 (2007)
- A.L. Kholkin, S.V. Kalinin, A. Roelofs, A. Gruverman. Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Springer-Verlag, N. Y. (2007). 310 p.
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