Effect of Friedel Oscillations on the Work Function of Ytterbium Nanofilms
Kuzmin M.V. 1, Mittsev M.A. 1
1Ioffe Institute, St. Petersburg, Russia
Email: m.kuzmin@mail.ioffe.ru

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The effect of standing waves of charge density (Friedel oscillations) generated by an interface of the metallic ytterbium nanofilm single-crystal silicon substrate type on the work function of ytterbium nanolayers has been studied. It is shown that in the range of nanofilm thicknesses from 0 to 8 monatomic layers, the work function has an oscillating character. This feature of the dependence of the work function on the nanofilm thickness is a consequence of the fact that the standing waves change nonmonotonically the power (momentum) of the electric double layer, which exists on the metal surface and affects the work function of the metal. This ultimately determines the oscillating nature of the dependence of the work function on the thickness of the nanofilms. Keywords: surface, nanofilm, work function, Friedel oscillations, electric double layer, ytterbium.
  1. G. Cao, Y. Wang. Nanostructures and nanomaterials: synthesis, properties, and applications. World Scientific (2011). V. 2. 581 p. https://doi.org/10.1142/7885
  2. A.M. Shikin. Formirovanie, elektronnaya struktura i svoystva nizkorazmernykh struktur na osnove metallov. BBN, Spb (2011). 432 s. ISBN 978-5-9651-0519-9 (in Russian)
  3. M.Yu. Dolomatov, R.Z. Bakhtizin, T.I. Sharipov. Fizicheskie osnovy nanoelektronoki. Yurait, M. 2023). 173 s. ISBN 978-5-534-14924-1 (in Russian)
  4. M.V. Kuzmin, M.A. Mitsev, ZhTF., 90, 1359 (2020). (in Russian)
  5. M.F. Cromme, C.P. Lutz, D.M. Elgler. Nature 363, 524 (1993)
  6. L.I. Johansson, H.I.P. Johansson, J.N. Andersen, E. Lundgren, R. Nyholm. Phys. Rev. Lett. 71, 2453 (1993)
  7. P.T. Sprunger, L. Peteren, E.W. Plummer, E. Laegsaard, F. Besenbacher. Science 275, 1764 (1997)
  8. P. Hofmann, B.G. Briner, M. Doering, H.-P. Rust, E.W. Plummer, A.M. Bradshaw. Phys. Rev. Lett. 79, 265 (1997)
  9. Zh. Zhang, Q. Niu, C.-K. Shih. Phys. Rev. Lett. 80, 5381 (1998)
  10. V.M. Silkin, I.A. Nechaev, E.V. Chulkov, P.M. Echenique. Surf. Sci. 600, 3875 (2006)
  11. M. Ono, T. Nishio, T. An, T. Eguchi, Y. Hasegawa. Appl. Surf. Sci. 256, 469 (2009)
  12. P. Gandri, F. Tompkins. Poverkhnostny ppotentsial. V sb.: eksperimental'nye metody issledovaniya kataliza / Pod red. R. Andersona. Mir, M., (1972). p. 104. (in Russian)
  13. Optical properties of semiconductors. Handbook on semiconductors / Ed. M. Balkanski. North-Holland, Amsterdam (1994). V. 2. 857 p.
  14. V.S. Fomenko. Emissionnye svoistva materialov. Spravochnik. Nauk. dumka. Kiev (1981). 338 p. (in Russian)
  15. N. Ashkroft, N. Mermin. Fizika tverdogo tela. V. 1. Mir, M. (1979). Per. s angl. Nell W. Ashcroft, N. David Mermin. Solid State Physics. Cornel University. N.Y., Chicago, San Francisco, Atlanta, Dallas, Montreal, Toronto, London, Sydney
  16. G.G. Vladimirov. Fizicheskaya electronika. Emissiya i vzaimodeistvie tchastits s tverdym telom. Lan', SPb (2013). 368 p. (in Russian)
  17. J.R. Smith, Phys. Rev. 181, 522 (1969)
  18. Svoistva elementov. Spravochnik. Metallurgiya, M., (1976). Tch. 1. 599 p. (in Russian).

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